{"product_id":"mf039700-semi-mf397-test-method-for-resistivity-of-silicon-bars-using-a-two-point-probe","title":"MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe","description":"\u003cp style=\"text-align:justify;\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method covers the measurement of the resistivity of single-crystal bars having cross sections that are uniform in area and square, rectangular or round in shape, and having resistivity between 0.0009 Ω·cm and 3000 Ω·cm.\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eThis Test Method is intended for use on single crystals of silicon of either n- or p-type for which the uniformity of the crystal cross section is such that the area can be accurately calculated. The specimen cross-sectional area shall be constant to within ±1% of the average area as determined by measurements along the crystal axis (refer to ¶ 12.2).\u003cbr\u003e \u003c\/p\u003e\u003cp\u003eThe ratio of the length to the maximum dimension of the cross section of the specimen shall not be less than 3:1 (refer to ¶ 12.1). The largest diameter tested by round robin was 37.5 mm (1.5 in.), and this is the largest diameter that can be measured by this method. The specimen shall normally have a surface finish of 0.4 µm (16 µin.) rms or less (refer to ANSI B46). Other surface finishes may be used if mutually acceptable; however, the multilaboratory precision figures of this test (refer to ¶ 16.1) then may no longer apply.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003cbr\u003eSEMI C19 — Specification for Acetone\u003cbr\u003eSEMI C28 — Specification and Guide for Hydrofluoric Acid\u003cbr\u003eSEMI C31 — Specification for Methanol\u003cbr\u003eSEMI C35 — Specification and Guide for Nitric Acid\u003cbr\u003eSEMI M59 — Terminology for Silicon Technology\u003cbr\u003eSEMI MF42 — Test Method for Conductivity Type of Extrinsic Semiconducting Materials\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI MF397-0812 (Reapproved 1023)\u003cbr\u003eSEMI MF397-0812 (Reapproved 0718)\u003cbr\u003eSEMI MF397-0812 (technical revision)\u003cbr\u003eSEMI MF397-1106 (Reapproved 1111)\u003cbr\u003eSEMI MF397-1106 (technical revision)\u003cbr\u003eSEMI MF397-02 (first SEMI publication)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI MF397-0812 (Reapproved 1023) - Current","offer_id":43106888384579,"sku":"17202","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI MF397-0812 (Reapproved 0718) - Superseded","offer_id":43106888417347,"sku":"4956","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI MF397-0812 - Superseded","offer_id":40234308501571,"sku":"9944","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI MF397-1106 (Reapproved 1111) - Superseded","offer_id":40234308567107,"sku":"9946","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI MF397-1106 - Superseded","offer_id":40234308632643,"sku":"9945","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI MF397-02 - Superseded","offer_id":40234308763715,"sku":"9943","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MFVolume_470c3688-49b8-4e0a-8fe6-3a8390a0e3c5.png?v=1776702522","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/mf039700-semi-mf397-test-method-for-resistivity-of-silicon-bars-using-a-two-point-probe","provider":"SEMI Dev 2","version":"1.0","type":"link"}