{"product_id":"m03700-semi-m37-test-method-for-measuring-etch-pit-density-epd-in-low-dislocation-density-indium-phosphide-wafers","title":"M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers","description":"\u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis test method was technically approved by the global Compound Semiconductor Committee and is the direct responsibility of the Japanese Compound Semiconductor Materials Committee. Current edition approved by the Japanese Regional Standards Committee on March 17, 1999. Initially available at www.semi.org April 1999; to be published June 1999. \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003e \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis document provides a method to measure etch pit density (EPD) in low dislocation density InP wafers. \u003c\/font\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI M37-0699 - Inactive","offer_id":40234357555267,"sku":"9570","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MVolume_0c915387-dce3-43f6-a78d-a26fe8ec35b4.png?v=1776702049","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/m03700-semi-m37-test-method-for-measuring-etch-pit-density-epd-in-low-dislocation-density-indium-phosphide-wafers","provider":"SEMI Dev 2","version":"1.0","type":"link"}