{"product_id":"m03200-semi-m32-guide-to-statistical-specifications","title":"M03200 - SEMI M32 - Guide to Statistical Specifications","description":"\u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits \u0026amp; Reviews Subcommittee on November 21, 2006. It was available at www.semi.org in February 2007. Originally published September 1998; previously published July 2004. \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003e \u003c\/font\u003e\u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eSpecifications are based on requirements negotiated between trading partners. This document describes an explicit specification form that defines the risk level as a part of parametric specifications. This approach uses process capability information to focus quality improvement efforts, reduce sampling, and maintain low risks. It is based on the fundamental belief that specifications should facilitate the movement toward processed-in quality instead of inspected-in quality. It is important for suppliers and their customers to acknowledge and mutually agree on quality levels so the methods employed will satisfy their expectations. Statistical specifications provide a convenient way to do this. \u003c\/font\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eSEMI M1 — Specifications for Polished Monocrystalline Silicon Wafers\u003cbr\u003eSEMI M18 — Format for Silicon Wafer Specification Form for Order Entry\u003cbr\u003eSEMI M57 — Guide for Specifying Silicon Annealed Wafers\u003cbr\u003eSEMI M59 — Terminology for Silicon Technology\u003cbr\u003eSEMI M61 — Specification for Silicon Epitaxial Wafers with Buried Layers\u003cbr\u003eSEMI M62 — Specifications for Silicon Epitaxial Wafers \u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI M32-0307 (Reapproved 0512) - Inactive","offer_id":40234363519043,"sku":"9559","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI M32-0307 - Superseded","offer_id":40234363715651,"sku":"9557","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI M32-0998 (Reapproved 0704) - Superseded","offer_id":40234363748419,"sku":"9561","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/MVolume_a54f2ada-bc22-4ffb-83c3-f4a451425078.png?v=1776702055","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/m03200-semi-m32-guide-to-statistical-specifications","provider":"SEMI Dev 2","version":"1.0","type":"link"}