{"product_id":"g06800-semi-g68-test-method-for-junction-to-case-thermal-resistance-measurements-in-air-environment-for-semiconductor-packages","title":"G06800 - SEMI G68 - Test Method for Junction-to-Case Thermal Resistance Measurements in Air Environment for Semiconductor Packages","description":"\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThe purpose of this Test Method is to determine the thermal resistance of semiconductor packages using thermal test chips. This Test Method deals with junction-to-case measurements of thermal resistance in air environment.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThe results of this Test Method are used to obtain the junction temperature.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThe measurement results are usually different from the results obtained by testing in the fluid bath environment described in SEMI G30 and SEMI G43.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Test Method uses SI units.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cp\u003eSEMI G30 — Test Method for Junction-to-Case Thermal Resistance Measurements of Ceramic Packages\u003cbr\u003eSEMI G32 — Guideline for Unencapsulated Thermal Test Chip\u003cbr\u003eSEMI G38 — Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages\u003cbr\u003eSEMI G42 — Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages\u003cbr\u003eSEMI G43 — Test Method for Junction-to-Case Thermal Resistance Measurements of Molded Plastic Packages\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G68-0996 (Reapproved 0318) - Inactive","offer_id":40234290970691,"sku":"4299","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G68-0996 (Reapproved 0811) - Superseded","offer_id":40234291068995,"sku":"12281","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G68-0996 (Reapproved 1104) - Superseded","offer_id":40234291134531,"sku":"12254","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_97435d19-b502-489c-9e5a-07942c30e1e5.png?v=1776702655","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g06800-semi-g68-test-method-for-junction-to-case-thermal-resistance-measurements-in-air-environment-for-semiconductor-packages","provider":"SEMI Dev 2","version":"1.0","type":"link"}