{"product_id":"g06000-semi-g60-test-method-for-the-measurement-of-electrostatic-properties-of-semiconductor-leadframe-interleafing-materials","title":"G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials","description":"\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Test Method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Test Method is suitable for all interleaf materials and may be used by vendors at outgoing inspection, or customers at incoming inspection.\u003c\/p\u003e\u003cp align=\"left\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cp\u003e\u003cfont\u003eNone.\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G60-94 (Reapproved 0318) - Inactive","offer_id":40234300702787,"sku":"4293","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G60-94 (Reapproved 0811) - Superseded","offer_id":40234300735555,"sku":"12275","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G60-94 (Reapproved 0302) - Superseded","offer_id":40234300768323,"sku":"12248","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_b717b76f-77fe-48d9-82d4-d382e4a98dee.png?v=1776702660","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g06000-semi-g60-test-method-for-the-measurement-of-electrostatic-properties-of-semiconductor-leadframe-interleafing-materials","provider":"SEMI Dev 2","version":"1.0","type":"link"}