{"product_id":"g05200-semi-g52-test-method-for-measurement-of-ionic-contamination-on-semiconductor-leadframes","title":"G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eContamination on leadframes can contribute to semiconductor\ndevice reliability problems. This Test Method may be used by lead frame\nmanufacturers at outgoing inspection and by users at incoming inspection.\nCorrelation of device reliability with contamination levels may lead to\nimproved leadframe cleaning processes.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\"\u003e\u003cbr\u003e\u003c\/p\u003e\n\n\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eThis Standard describes the procedure to determine ionic\ncontamination on leadframes using a water extraction method. The method is\nsensitive to Na+, NH4+, K+, Cl−, NO3-, Br−, SO42−, PO43−.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eNone\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003e\u003cb\u003eRevision History\u003c\/b\u003e\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eSEMI G52-1120 (technical revision)\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eSEMI G52-1115 (technical revision)\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eSEMI G52-90 (Reapproved 1104)\u003c\/font\u003e\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cfont face=\"arial\" size=\"2\"\u003eSEMI G52-90 (first published)\u003c\/font\u003e\u003cspan style=\"font-family: arial; font-size: small;\"\u003e \u003c\/span\u003e\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cp\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G52-1120 - Current","offer_id":40234283630659,"sku":"14317","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G52-1115 - Superseded","offer_id":40234283728963,"sku":"4280","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G52-90 (Reapproved 1104) - Superseded","offer_id":40234283860035,"sku":"12243","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_fee64fd3-bfc9-4c5f-840d-5180d843ffba.png?v=1776702670","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g05200-semi-g52-test-method-for-measurement-of-ionic-contamination-on-semiconductor-leadframes","provider":"SEMI Dev 2","version":"1.0","type":"link"}