{"product_id":"g04200-semi-g42-specification-for-thermal-test-board-standardization-for-measuring-junction-to-ambient-thermal-resistance-of-semiconductor-packages","title":"G04200 - SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages","description":"\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Document provides the requirements for a standard thermal resistance test board to be used in junction-to-ambient thermal resistance measurement of a semiconductor package under still- and forced-air condition as a referee method.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Document describes the thermal resistance test board for measurement of the following packages:\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e• Dual-In-Line Packages (DIP),\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e• Plastic Chip Carrier Package (PCC),\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e• Quad Flat Package (QFP),\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e• Pin Grid Array Package (PGA), and\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e•Ball Grid Array Package (BGA).\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003eThis Document uses SI units.\u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e \u003c\/p\u003e\u003cp align=\"justify\" dir=\"ltr\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cp\u003eSEMI G32 — Guideline for Unencapsulated Thermal Test Chip\u003cbr\u003eSEMI G38 — Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G42-0996 (Reapproved 0318) - Inactive","offer_id":40234304569411,"sku":"4290","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G42-0996 (Reapproved 0811) - Superseded","offer_id":40234304634947,"sku":"12274","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G42-0996 (Reapproved 1104) - Superseded","offer_id":40234304766019,"sku":"12236","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_58fafe1b-6a46-49ed-8879-409a81852184.png?v=1776702661","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g04200-semi-g42-specification-for-thermal-test-board-standardization-for-measuring-junction-to-ambient-thermal-resistance-of-semiconductor-packages","provider":"SEMI Dev 2","version":"1.0","type":"link"}