{"product_id":"g03200-semi-g32-guideline-for-unencapsulated-thermal-test-chip","title":"G03200 - SEMI G32 - Guideline for Unencapsulated Thermal Test Chip","description":"\u003cp class=\"StdsIndent\" style=\"MARGIN: 0in 0.5in 6pt\"\u003e\u003cspan style=\"FONT-SIZE: 10pt; FONT-FAMILY: Arial\"\u003eThis Standard was technically approved by the global Assembly \u0026amp; Packaging Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on July 1, 2011. Available at www.semiviews.org and www.semi.org in August 2011; originally published in 1994.\u003c?xml:namespace prefix = o ns = \"urn:schemas-microsoft-com:office:office\" \/\u003e\u003co:p\u003e\u003c\/o:p\u003e\u003c\/span\u003e\u003c\/p\u003e \u003cp class=\"StdsIndent\" style=\"MARGIN: 0in 0.5in 6pt\"\u003e\u003cspan style=\"FONT-SIZE: 10pt; FONT-FAMILY: Arial\"\u003e\u003co:p\u003e \u003c\/o:p\u003e\u003c\/span\u003e\u003c\/p\u003e \u003cp class=\"StdsText\" style=\"MARGIN: 6pt 0in\"\u003e\u003cspan style=\"FONT-FAMILY: Arial\"\u003e\u003cfont size=\"2\"\u003eNOTICE: This Document was reapproved with minor editorial changes.\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e \u003cp class=\"StdsText\" style=\"MARGIN: 6pt 0in\"\u003e\u003cspan style=\"FONT-FAMILY: Arial\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e \u003cp class=\"StdsText\" style=\"MARGIN: 6pt 0in\"\u003e\u003cspan style=\"FONT-FAMILY: Arial\"\u003e\u003cfont size=\"2\"\u003eThis Guideline details recommendations for a standardized thermal test chip design for referee test purposes. A sample data format for the test chip can be found in Appendix 1. Based on the results of computer simulations of various chip-substrate configurations, the following recommendations are made for the design of thermal test chips for VLSI package characterization.\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G32-94 - Superseded","offer_id":40234363158595,"sku":"12223","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_fe325722-f07c-402b-a188-5c2677dc1cc8.png?v=1776701908","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g03200-semi-g32-guideline-for-unencapsulated-thermal-test-chip","provider":"SEMI Dev 2","version":"1.0","type":"link"}