{"product_id":"g02300-semi-g23-test-method-of-inductance-for-internal-traces-of-semiconductor-packages","title":"G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThis Test Method describes the measurement method for the inductance of internal traces of semiconductor packages.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThis Test Method is applicable for the measurement of package inductance that is greater than 0.5 nH.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThis Test Method describes the measurement of a pin grid array, one of the package types, as a sample.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThis Test Method is also applicable to other types of packages.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThe inductance in this Standard is limited to that of internal traces only and does not contain the portions contributed by the exposed areas such as pins and wires.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eThis Standard uses SI units.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eNone.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-0996 (Reapproved 0823)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-0996 (Reapproved 0318)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-0996 (Reapproved 0811)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-0996 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-89 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;'\u003eSEMI G23-84 (first published)\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI G23-0996 (Reapproved 0823) - Current","offer_id":43106894348355,"sku":"17076","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G23-0996 (Reapproved 0318) - Superseded","offer_id":43106894381123,"sku":"4288","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G23-0996 (Reapproved 0811) - Superseded","offer_id":40234292084803,"sku":"12312","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI G23-0996 - Superseded","offer_id":40234292183107,"sku":"12219","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/GVolume_2f19687d-9d8f-4603-8899-2e78464e4a10.png?v=1776702663","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/g02300-semi-g23-test-method-of-inductance-for-internal-traces-of-semiconductor-packages","provider":"SEMI Dev 2","version":"1.0","type":"link"}