{"product_id":"f05300-semi-f53-test-method-for-evaluating-the-electromagnetic-susceptibility-of-thermal-mass-flow-controllers","title":"F05300 - SEMI F53 - Test Method for Evaluating the Electromagnetic Susceptibility of Thermal Mass Flow Controllers","description":"\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cfont size=\"2\"\u003eThe\npurpose of this Document is to define a structured method for testing and\nevaluating the electromagnetic susceptibility of mass flow controllers (MFCs).\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cfont size=\"2\"\u003e\u003cbr\u003e\u003c\/font\u003e\u003cp class=\"StdsH2\"\u003e\u003cspan style='font-family:\"Arial\",sans-serif'\u003e\u003cfont size=\"2\"\u003eThis\nDocument contains the requirements and test method that can be used to evaluate\nwhether an MFC will maintain its functional characteristics when subjected to electromagnetic\ninterference (EMI) levels typical of the industry. The test method covers both\nthe radiated susceptibility (RS) and conducted susceptibility (CS) of the MFC when\nexposed to EMI. The electromagnetic susceptibility requirements are extracted\nfrom MIL-STD-461G, and the test method is a composite of the RS103, and CS106\ntest methods defined in MIL-STD 461G.\u003co:p\u003e\u003c\/o:p\u003e\u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e\n\n\n\n\n\n\u003c\/p\u003e\u003cp class=\"MsoNormal\"\u003e\u003cspan style=\"line-height: 107%; font-family: Arial, sans-serif;\"\u003e\u003cfont size=\"2\"\u003e \u003c\/font\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cfont size=\"2\"\u003e\u003cfont size=\"2\" face=\"Arial\"\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\n\u003cp dir=\"ltr\" align=\"justify\"\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003c\/p\u003e\n\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/font\u003e","brand":"semi.org","offers":[{"title":"SEMI F53-0120 - Current","offer_id":40234259710019,"sku":"13718","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI F53-0600 (Reapproved 0412) - Superseded","offer_id":40234259841091,"sku":"4035","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI F53-0600 (Reapproved 0307) - Superseded","offer_id":40234259906627,"sku":"10797","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI F53-0600 - Superseded","offer_id":40234260004931,"sku":"10796","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/FVolume_a140f7e6-3133-49b5-b9f3-cb003c503f30.png?v=1776702761","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/f05300-semi-f53-test-method-for-evaluating-the-electromagnetic-susceptibility-of-thermal-mass-flow-controllers","provider":"SEMI Dev 2","version":"1.0","type":"link"}