{"product_id":"d06400-semi-d64-test-method-for-measuring-the-spatial-contrast-ratio-of-flat-panel-display","title":"D06400 - SEMI D64 - Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display","description":"\u003cp class=\"StdsIndent\" style=\"MARGIN:0in 0.5in 6pt;\"\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eContrast has a significant influence on the perceived image quality in display devices.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eFor several decades, physical contrast metrics such as contrast ratio (CR) and contrast modulation (CM) have been widely used to quantify the contrast performance of display devices.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eA robust standardized test method for measuring the average picture level (APL) contrast ratios of flat panel display (FPD) systems is required to enable quality control in high volume manufacturing.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eExisting international standards use full screen sequential test patterns that are not suitable for modern FPD systems that dynamically adjust gray levels based on image contents. International standards (IEC 61947-1, ISO\/FDIS 9241-307, and VESA 2.0) define the CR and CM.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSequential full screen test pattern does not give constant results for the new display technologies that dynamically adjust gray levels based on image contents.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eThe test pattern where regions of various APL exist inside one image, therefore, is more reliable to assess the display device in terms of contrast ratio. APL values of various images, therefore, should be considered.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eConsequently, this Test Method requires a pair of specified test patterns with APL variation, rather than sequential APL variation, used to evaluate the APL contrast ratio of a display device under test.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eThis Standard is applicable to FPD.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eThe scope of the term ‘contrast’ is only related to the luminance contrast in this Standard.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eThe test method in this Standard uses APL test patterns with the APL specified for both the region under test and the background region to determine the APL contrast ratio.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003e\u003cstrong\u003eReferenced SEMI Standards\u003c\/strong\u003e (purchase separately)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eNone.\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI D64-0723 (technical revision)\u003c\/span\u003e\u003c\/p\u003e\u003cp\u003e\u003cspan style='font-family:\"Arial\",sans-serif;font-size:10.0pt;'\u003eSEMI D64-0811 (first published)\u003c\/span\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI D64-0723 - Current","offer_id":43106905587779,"sku":"17031","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI D64-0811 - Superseded","offer_id":43106905620547,"sku":"3189","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/DVolume_d057d9f0-699d-4e49-b06a-52c894733682.png?v=1776702939","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/d06400-semi-d64-test-method-for-measuring-the-spatial-contrast-ratio-of-flat-panel-display","provider":"SEMI Dev 2","version":"1.0","type":"link"}