{"product_id":"d04700-semi-d47-test-method-for-measurement-of-bent-cold-cathode-flourescent-lamps","title":"D04700 - SEMI D47 - Test Method for Measurement of Bent Cold Cathode Flourescent Lamps","description":"\u003cp\u003eThis standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits \u0026amp; Reviews Subcommittee on November 21, 2006. It was available at www.semi.org in February 2007. \u003c\/p\u003e \u003cp\u003e \u003c\/p\u003e \u003cp\u003eThe purpose of this document is to standardize the method for measurement of electrical and optical characteristics of bent cold cathode fluorescent lamp (CCFL). \u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003eSEMI D35 — Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI D47-0307 - Inactive","offer_id":40234243162179,"sku":"3166","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/DVolume_10abedf1-a1a0-49c2-b69f-987d879887df.png?v=1776702956","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/d04700-semi-d47-test-method-for-measurement-of-bent-cold-cathode-flourescent-lamps","provider":"SEMI Dev 2","version":"1.0","type":"link"}