{"product_id":"d03500-semi-d35-test-method-for-measurement-of-cold-cathode-fluorescent-lamp-ccfl-characteristics","title":"D03500 - SEMI D35 - Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics","description":"\u003cfont size=\"2\" face=\"Arial\"\u003e\u003cfont size=\"2\" face=\"Arial\"\u003e\u003cspan lang=\"EN\"\u003e \u003cp align=\"justify\"\u003eThis Standard was technically approved by the Flat Panel Display – Color Filter \u0026amp; Optical Elements Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 13, 2009. Available at www.semi.org in July 2009; originally published November 2003.\u003c\/p\u003e \u003cp align=\"justify\"\u003e  \u003c\/p\u003e \u003cp align=\"justify\"\u003eNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use.\u003c\/p\u003e \u003cp align=\"justify\"\u003e　\u003c\/p\u003e \u003cp align=\"justify\"\u003eThe purpose of this Document is to standardize the method for measurement of electrical and optical characteristics of cold cathode fluorescent lamp (CCFL).\u003c\/p\u003e \u003cp align=\"justify\"\u003e \u003c\/p\u003e \u003cp align=\"justify\"\u003eThis method is to be used by CCFL suppliers and users to evaluate quality of products as well as items under development.\u003c\/p\u003e \u003cp align=\"justify\"\u003e　\u003c\/p\u003e \u003cp align=\"justify\"\u003eThis method shall be used in general for CCFL to measure the initial characteristics of CCFL (single item) and its reliability after tests, and to carry out quality inspection for incoming and outgoing CCFLs.\u003c\/p\u003e \u003cp align=\"justify\"\u003e\u003c\/p\u003e \u003cp align=\"justify\"\u003e　\u003c\/p\u003e\u003c\/span\u003e\u003c\/font\u003e\u003c\/font\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eNone.\u003cbr\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI D35-1103 (Reapproved 0709) - Inactive","offer_id":40234230186051,"sku":"3149","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI D35-1103E - Superseded","offer_id":40234230251587,"sku":"12558","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI D35-1103 - Superseded","offer_id":40234230284355,"sku":"12556","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/DVolume_bd633fbd-9306-4985-9174-2b73edacfb15.png?v=1776702971","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/d03500-semi-d35-test-method-for-measurement-of-cold-cathode-fluorescent-lamp-ccfl-characteristics","provider":"SEMI Dev 2","version":"1.0","type":"link"}