{"product_id":"d01500-semi-d15-fpd-glass-substrate-surface-waviness-measurement-method","title":"D01500 - SEMI D15 - FPD Glass Substrate Surface Waviness Measurement Method","description":"\u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis method was technically approved by the global Flat Panel Display Committee and is the direct responsibility of the Japanese FPD Materials and Components Committee. Current edition approved by the Japanese Regional Standards Committee on April 28, 2003. Initially available at www.semi.org June 2003; to be published July 2003. Originally published December 1996. \u003c\/font\u003e \u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003e\u003c\/font\u003e \u003c\/p\u003e \u003cp\u003e\u003cfont face=\"Microsoft Sans Serif\" size=\"2\"\u003eThis document covers the measurement of FPD glass substrate surface waviness by measuring instruments employing mechanical stylus, optical stylus, and optical interferometric measurement methods. \u003c\/font\u003e \u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003e\u003cfont\u003eSEMI D3 — Quality Area Specification for Flat Panel Display Substrates \u003cbr\u003e \u003cfont\u003eSEMI D9 — Definitions for Flat Panel Display Substrates \u003cbr\u003e\u003c\/font\u003e\u003c\/font\u003e\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI D15-1296 (Reapproved 0703) - Inactive","offer_id":40234242605123,"sku":"3115","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/DVolume_3f808a6e-57c3-4910-b306-7fe455a08668.png?v=1776703001","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/d01500-semi-d15-fpd-glass-substrate-surface-waviness-measurement-method","provider":"SEMI Dev 2","version":"1.0","type":"link"}