{"product_id":"c01000-semi-c10-guide-for-determination-of-method-detection-limits","title":"C01000 - SEMI C10 - Guide for Determination of Method Detection Limits","description":"\u003cp dir=\"ltr\" align=\"justify\"\u003eThis Standard was technically approved by the Liquid Chemicals Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 25, 2014. Available at www.semiviews.org and www.semi.org in November 2014; originally published in 1998; previously published November 2009.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eNOTICE: This Document was reapproved with minor editorial changes.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eTo provide a minimal set of guidelines for the quantitative determination of a method detection limit (MDL) from data supporting a SEMI Process Chemicals or Gases specification.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"justify\"\u003eThis Guide applies to trace contaminants specified in SEMI Process Chemicals or Gases Standards and Guides. All relevant trace contaminants should have an MDL determined from a regression analysis of a calibration curve that is equal to, or less than, their specifications. This Guide is intended for use in both establishing new Specifications within SEMI as well as verification of performance to SEMI Specifications.\u003c\/p\u003e \u003cp dir=\"ltr\" align=\"left\"\u003e\u003c\/p\u003e\u003cp dir=\"ltr\" align=\"justify\"\u003e　\u003c\/p\u003e\u003cb\u003eReferenced SEMI Standards\u003c\/b\u003e\u003cbr\u003e\u003cp\u003eSEMI C16 — Guide for Precision Reporting\/Data Traceability\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI C10-1109 (Reapproved 1114) - Current","offer_id":40234233495619,"sku":"2107","price":62700.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI C10-1109 - Superseded","offer_id":40234233593923,"sku":"11711","price":62700.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI C10-0305 - Superseded","offer_id":40234233659459,"sku":"11710","price":62700.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI C10-0299 - Superseded","offer_id":40234233757763,"sku":"6219","price":62700.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/CVolume_pc_540879d5-83ff-4adc-90c8-2240b38d6eba.png?v=1776703133","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/c01000-semi-c10-guide-for-determination-of-method-detection-limits","provider":"SEMI Dev 2","version":"1.0","type":"link"}