{"product_id":"a00400-semi-a4-specification-for-the-automated-test-equipment-tester-event-messaging-for-semiconductors-tems","title":"A00400 - SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS)","description":"\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eNOTICE: \u003c\/strong\u003eThe designation of SEMI A4 was updated during the 0821 publishing cycle to reflect the publication of SEMI A4.1.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e1  Purpose\u003cbr\u003e1.1  Semiconductor test operations involving automated test equipment (ATE) today are experiencing increasing use of data for real-time data analysis and real-time ATE input and control, to improve test yield, throughput, efficiency, and product quality. At the same time, test equipment and test operations around the world use a diverse range of data formats, specifications, and interface requirements that create significant customer service and application engineering costs for ATE vendors, OSAT companies, IDM test operations, software providers, and handler equipment. The goal of this Specification is to create a vendor neutral way to collect test cell data.\u003cbr\u003e2  Scope\u003cbr\u003e2.1  This Specification describes the data communication between the test cell and an external server.\u003cbr\u003e2.2  This Specification covers test cell data and operating conditions collection.\u003cbr\u003e2.3  This Specification indicates the minimum interface requirements along with methods for adding custom capabilities.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSubordinate Standards (included)\u003cbr\u003eSEMI A4.1 — Specification for HTTP JSON Protocol Implementation for Tester Event Messaging for Semiconductors (TEMS)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eReferenced SEMI Standards \u003c\/strong\u003e(purchase separately)\u003cbr\u003eNone.\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eRevision History\u003c\/strong\u003e\u003cbr\u003eSEMI A4-0821 (designation update)\u003cbr\u003eSEMI A4-0421 (first published)\u003c\/p\u003e\u003cp\u003e \u003c\/p\u003e\u003cp\u003eSEMI A4.1-0821 (first published)\u003c\/p\u003e","brand":"semi.org","offers":[{"title":"SEMI A4-0821 - Current","offer_id":40234374430787,"sku":"14651","price":31900.0,"currency_code":"JPY","in_stock":true},{"title":"SEMI A4-0421 - Superseded","offer_id":40234374463555,"sku":"14470","price":31900.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0567\/3402\/3747\/files\/AVolume_1a089dfb-356f-4cc3-a0ba-8bb063e7498b.png?v=1776701723","url":"https:\/\/store-dev2.semi.org\/en-jp\/products\/a00400-semi-a4-specification-for-the-automated-test-equipment-tester-event-messaging-for-semiconductors-tems","provider":"SEMI Dev 2","version":"1.0","type":"link"}