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C03600 - SEMI C36 - Specification for Phosphoric Acid
SEMI C36 - Specification for Phosphoric Acid Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C04200 - SEMI C42 - 水酸化ナトリウム（固体）の仕様
SEMI C42 - 水酸化ナトリウム（固体）の仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C07200 - SEMI C72 - Guide for Propylene-Glycol-Mono-Methyl-Ether (PGME), Propylene-Glycol-Mono-Methyl-Ether-Acetate (PGMEA) and the Mixture 70wt% PGME/30wt% PGMEA
SEMI C72 - Guide for Propylene-Glycol-Mono-Methyl-Ether (PGME), Propylene-Glycol-Mono-Methyl-Ether-Acetate (PGMEA) and the Mixture 70wt% PGME/30wt% PGMEA Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C09400 - SEMI C94 - Guide for Cyclohexanone
SEMI C94 - Guide for Cyclohexanone Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D04500 - SEMI D45 - FPDカラーフィルタ用高抵抗樹脂ブラックマトリクスの抵抗値測定方法
SEMI D45 - FPDカラーフィルタ用高抵抗樹脂ブラックマトリクスの抵抗値測定方法 Sale priceMember Price: ¥113
Non-Member Price: ¥38,100
C01600 - SEMI C16 - Guide for Precision and Data Reporting Practices
SEMI C16 - Guide for Precision and Data Reporting Practices Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D03400 - SEMI D34 - Test Method for FPD Polarizing Films
SEMI D34 - Test Method for FPD Polarizing Films Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C03700 - SEMI C37 - Specification for Phosphoric Etchants
SEMI C37 - Specification for Phosphoric Etchants Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C06300 - SEMI C63 - Specification for Organosilicate Precursors Used in Low K CVD Processes
SEMI C63 - Specification for Organosilicate Precursors Used in Low K CVD Processes Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D02900 - SEMI D29 - Test Method for Heat Resistance in Flat Panel Display (FPD) Color Filters
SEMI D29 - Test Method for Heat Resistance in Flat Panel Display (FPD) Color Filters Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D04400 - SEMI D44 - Specification for Reference Position of Single Substrate for Handing Off On Tool
SEMI D44 - Specification for Reference Position of Single Substrate for Handing Off On Tool Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D03600 - SEMI D36 - 液晶顯示器背光模組的專用術語
SEMI D36 - 液晶顯示器背光模組的專用術語 Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D00500 - SEMI D5 - FPD基板の標準サイズ
SEMI D5 - FPD基板の標準サイズ Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
D03300 - SEMI D33 - バックライトユニットの光学特性の測定方法
SEMI D33 - バックライトユニットの光学特性の測定方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C00333 - SEMI C3.33 - Standard for Boron Trichloride (BCl3) (Provisional)
SEMI C3.33 - Standard for Boron Trichloride (BCl3) (Provisional) Sale price Member Price : ¥113
C01500 - SEMI C15 - PPMおよびPPB水分標準のためのテスト方法
SEMI C15 - PPMおよびPPB水分標準のためのテスト方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C00315 - SEMI C3.15 - Standard for Nitrogen (N2), In Cylinders, 99.9992% Quality
SEMI C3.15 - Standard for Nitrogen (N2), In Cylinders, 99.9992% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C05500 - SEMI C55 - Specification for Liquid Carbon Dioxide (CO2) Used in Near Critical, Critical and Supercritical Applications, >/ 99.99% Quality
SEMI C55 - Specification for Liquid Carbon Dioxide (CO2) Used in Near Critical, Critical and Supercritical Applications, >/ 99.99% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
3D00500 - SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures
SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D04800 - SEMI D48 - Specification for Reference Position of Substrate ID to Specify Datum Line for ID Reader for Handing Off/On Tool
SEMI D48 - Specification for Reference Position of Substrate ID to Specify Datum Line for ID Reader for Handing Off/On Tool Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry
SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00334 - SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality
SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00343 - SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional)
SEMI C3.43 - Standard for Hydrogen Fluoride (HF), Anhydrous (Provisional) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C04100 - SEMI C41 - Specification and Guide for 2-Propanol
SEMI C41 - Specification and Guide for 2-Propanol Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
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