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E13600 - SEMI E136 - Test Method for Determining the Output Power of RF Generators Used in Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E136 - Test Method for Determining the Output Power of RF Generators Used in Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E12900 - SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility
SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D06700 - SEMI D67 - FPD偏光板の防汚性と耐薬品性の試験方法
SEMI D67 - FPD偏光板の防汚性と耐薬品性の試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
E07800 - SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド
SEMI E78 - 装置のための静電気放電（ESD）と静電気吸着（ESA）の評価と管理へのガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E03005 - SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM)
SEMI E30.5 - Specification for Metrology Specific Equipment Model (MSEM) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E14300 - SEMI E143 - Test Method for Measuring Power and Variation into a 50-Ω Load and Power Variation and Spectrum into a Load with a VSWR of 2.0 at any phase Angle
SEMI E143 - Test Method for Measuring Power and Variation into a 50-Ω Load and Power Variation and Spectrum into a Load with a VSWR of 2.0 at any phase Angle Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E06800 - SEMI E68 - Test Method for Determining Warm-Up Time of Mass Flow Controllers
SEMI E68 - Test Method for Determining Warm-Up Time of Mass Flow Controllers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E11400 - SEMI E114 - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E114 - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E16700 - SEMI E167 - Specification for Equipment Energy Saving Mode Communications (EESM)
SEMI E167 - Specification for Equipment Energy Saving Mode Communications (EESM) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E15700 - SEMI E157 - Specification for Module and Substrate Process TrackingE15700 - SEMI E157 - Specification for Module and Substrate Process Tracking
SEMI E157 - Specification for Module and Substrate Process Tracking Sale price Member Price : ¥113
D07800 - SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices
SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E05418 - SEMI E54.18 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pump Device
SEMI E54.18 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pump Device Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM)
SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E11700 - SEMI E117 - Specification for Reticle Load Port
SEMI E117 - Specification for Reticle Load Port Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E14200 - SEMI E142 - Specification for Substrate Mapping
SEMI E142 - Specification for Substrate Mapping Sale price Member Price : ¥225
E05404 - SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet
SEMI E54.4 - Specification for Sensor/Actuator Network Communications for DeviceNet Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04700 - SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様
SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様 Sale priceMember Price: ¥270
Non-Member Price: ¥75,400
E08800 - SEMI E88 - Specification for AMHS Storage SEM (Stocker SEM)
SEMI E88 - Specification for AMHS Storage SEM (Stocker SEM) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F06000 - SEMI F60 - Test Method for ESCA Evaluation of Surface Composition of Wetted Surfaces of Passivated 316L Stainless Steel Components
SEMI F60 - Test Method for ESCA Evaluation of Surface Composition of Wetted Surfaces of Passivated 316L Stainless Steel Components Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E08000 - SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position)
SEMI E80 - Test Method for Determining Attitude Sensitivity of Mass Flow Controllers (Mounting Position) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E12300 - SEMI E123 - ハンドラ装置の特定装置モデル（HSEM）のスタンダード
SEMI E123 - ハンドラ装置の特定装置モデル（HSEM）のスタンダード Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F05300 - SEMI F53 - サーマル・マスフローコントローラの電磁感受性評価の試験方法
SEMI F53 - サーマル・マスフローコントローラの電磁感受性評価の試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
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