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G04200 - SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages
SEMI G42 - Specification for Thermal Test Board Standardization for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases
SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials
SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials
SEMI MF43 - Test Method for Resistivity of Semiconductor Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF161900 - SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F10100 - SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems
SEMI F101 - Test Method for Determining Pressure Regulator Performance in Gas Distribution Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F07500 - SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing
SEMI F75 - Guide for Quality Monitoring of Ultrapure Water Used in Semiconductor Manufacturing Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
HB00900 - SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED
SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M08000 - SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers
SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G04300 - SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法
SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
F08100 - SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications
SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M07700 - SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA
SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal
SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers
SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04000 - SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing
SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M05900 - SEMI M59 - シリコン技術の用語集
SEMI M59 - シリコン技術の用語集 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G02800 - SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様
SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M06600 - SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法
SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
F06300 - SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing
SEMI F63 - Guide for Ultrapure Water Used in Semiconductor Processing Sale priceMember Price: ¥252
Non-Member Price: ¥62,700
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