SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

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1910 products

E12000 - SEMI E120 - Specification for the Common Equipment Model (CEM)
SEMI E120 - Specification for the Common Equipment Model (CEM) Sale price Member Price : ¥113
E03900 - SEMI E39 - Specification for Object Services: Concepts, Behavior, and Services
SEMI E39 - Specification for Object Services: Concepts, Behavior, and Services Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F10500 - SEMI F105 - Guide for Metallic Material Compatibility in Gas Distribution Systems
SEMI F105 - Guide for Metallic Material Compatibility in Gas Distribution Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
World Fab Forecast - Subscription
World Fab Forecast Subscription Sale priceMember Price: ¥6,300
Non-Member Price: ¥1,829,900
E08700 - SEMI E87 - Specification for Carrier Management (CMS)
SEMI E87 - Specification for Carrier Management (CMS) Sale price Member Price : ¥113
E00500 - SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II）
SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II） Sale priceMember Price: ¥135
Non-Member Price: ¥75,400
E13200 - SEMI E132 - Specification for Equipment Client Authentication and Authorization
SEMI E132 - Specification for Equipment Client Authentication and Authorization Sale price Member Price : ¥113
E09000 - SEMI E90 - Specification for Substrate Tracking
SEMI E90 - Specification for Substrate Tracking Sale price Member Price : ¥113
E11600 - SEMI E116 - Specification for Equipment Performance Tracking
SEMI E116 - Specification for Equipment Performance Tracking Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
E03500 - SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Worldwide Assembly & Test Facility Database (IDM + OSAT)
Worldwide Assembly & Test Facility Database (IDM + OSAT) Sale priceMember Price: ¥7,000
Non-Member Price: ¥1,813,400
D00600 - SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates
SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price¥49,500 JPY Sale price¥31,900 JPY
F07700 - SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems
SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F03800 - SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters
SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters Sale priceMember Price: ¥113
Non-Member Price: ¥31,900