SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process

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1910 products

MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer
SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F06900 - SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems
SEMI F69 - Test Method for Transport and Shock Testing of Gas Delivery Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M08500 - SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry
SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G02400 - SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法
SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF015400 - SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G06800 - SEMI G68 - Test Method for Junction-to-Case Thermal Resistance Measurements in Air Environment for Semiconductor Packages
SEMI G68 - Test Method for Junction-to-Case Thermal Resistance Measurements in Air Environment for Semiconductor Packages Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF072800 - SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements
SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M06600 - SEMI M66 - Test Method to Extract Effective Work Function in Oxide and High-K Gate Stacks Using the MIS Flat Band Voltage-Insulator Thickness Technique
SEMI M66 - Test Method to Extract Effective Work Function in Oxide and High-K Gate Stacks Using the MIS Flat Band Voltage-Insulator Thickness Technique Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F06100 - SEMI F61 - Guide to Design and Operation of a Semiconductor Ultrapure Water System
SEMI F61 - Guide to Design and Operation of a Semiconductor Ultrapure Water System Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF152900 - SEMI MF1529 - Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
SEMI MF1529 - Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G04500 - SEMI G45 - Practice for Flash Characteristics of Thermosetting Molding Compounds
SEMI G45 - Practice for Flash Characteristics of Thermosetting Molding Compounds Sale priceMember Price: ¥113
Non-Member Price: ¥31,900