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3D00800 - SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process
SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carrier Wafers in a 3DS-IC Temporary Bond-Debond (TBDB) Process Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C04900 - SEMI C49 - トリメチルホウ酸のガイド
SEMI C49 - トリメチルホウ酸のガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C04700 - SEMI C47 - Guide for Trans 1,2 Dichloroethylene
SEMI C47 - Guide for Trans 1,2 Dichloroethylene Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C03200 - SEMI C32 - メチルエチルケトンの仕様
SEMI C32 - メチルエチルケトンの仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C04200 - SEMI C42 - Specification for Sodium Hydroxide Pellets
SEMI C42 - Specification for Sodium Hydroxide Pellets Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00348 - SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality
SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C01000 - SEMI C10 - MDL（定量下限値）決定に関するガイド
SEMI C10 - MDL（定量下限値）決定に関するガイド Sale priceMember Price: ¥270
Non-Member Price: ¥75,400
D05400 - SEMI D54 - FPD生産における基板管理(SMS-FPD)のための仕様
SEMI D54 - FPD生産における基板管理(SMS-FPD)のための仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C04500 - SEMI C45 - Specification and Guide for Tetraethylorthosilicate (TEOS)
SEMI C45 - Specification and Guide for Tetraethylorthosilicate (TEOS) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D04500 - SEMI D45 - Test Method for Resistance of Resin Black Matrix with High Resistance for FPD Color Filter
SEMI D45 - Test Method for Resistance of Resin Black Matrix with High Resistance for FPD Color Filter Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00327 - SEMI C3.27 - Specification for Boron Trifluoride (BF3) in Cylinders, 99.0% Quality
SEMI C3.27 - Specification for Boron Trifluoride (BF3) in Cylinders, 99.0% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C06100 - SEMI C61 - Specification for Bar-Code Container Identification
SEMI C61 - Specification for Bar-Code Container Identification Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
3D01200 - SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers
SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C09600 - SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries
SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E19700 - SEMI E197 - Specification for Large Tray Stack FOUP (LTSF)
SEMI E197 - Specification for Large Tray Stack FOUP (LTSF) Sale priceMember Price:
Non-Member Price: ¥31,900
T02700 - SEMI T27 - Specification for Traceability Identification Label of Component Parts
SEMI T27 - Specification for Traceability Identification Label of Component Parts Sale priceMember Price:
Non-Member Price: ¥31,900
T02600 - SEMI T26 - Specification for Electronic Supply Chain Traceability Using Distributed Ledger Technology
SEMI T26 - Specification for Electronic Supply Chain Traceability Using Distributed Ledger Technology Sale priceMember Price:
Non-Member Price: ¥31,900
M09500 - SEMI M95 - Test Method for Net Carrier Density and Resistivity of Silicon Epitaxial Layer by Capacitance-Voltage Measurements with an Evaporated Metal Schottky Diode
SEMI M95 - Test Method for Net Carrier Density and Resistivity of Silicon Epitaxial Layer by Capacitance-Voltage Measurements with an Evaporated Metal Schottky Diode Sale priceMember Price:
Non-Member Price: ¥31,900
E19600 - SEMI E196 - Guide for Equipment Edge Data Governance
SEMI E196 - Guide for Equipment Edge Data Governance Sale priceMember Price:
Non-Member Price: ¥31,900
E19500 - SEMI E195 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components
SEMI E195 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components Sale priceMember Price:
Non-Member Price: ¥31,900
E19400 - SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons
SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons Sale priceMember Price:
Non-Member Price: ¥31,900
M09400 - SEMI M94 - Specification for Silicon Carbide Engineered Substrates
SEMI M94 - Specification for Silicon Carbide Engineered Substrates Sale priceMember Price:
Non-Member Price: ¥31,900
E19300 - SEMI E193 - Specification for 300 mm Film Frame FOUP (FFF)
SEMI E193 - Specification for 300 mm Film Frame FOUP (FFF) Sale priceMember Price:
Non-Member Price: ¥31,900
MS01500 - SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels
SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels Sale priceMember Price:
Non-Member Price: ¥31,900
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