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1222 products

G00800 - SEMI G8 - 金めっきの試験方法
SEMI G8 - 金めっきの試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥29,700
M04900 - SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド
SEMI M49 - 130 nmから65 nmへの技術世代のシリコンウェーハ用ジオメトリ測定システム規定のためのガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
P04600 - SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML
SEMI P46 - Specification for Critical Dimension (CD) Measurement Information Data on Photomask by XML Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P02800 - SEMI P28 - 集積回路製造用オーバーレイ計測テストパターン
SEMI P28 - 集積回路製造用オーバーレイ計測テストパターン Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
P02600 - SEMI P26 - フォトレジストの感度測定用パラメータチェックリスト
SEMI P26 - フォトレジストの感度測定用パラメータチェックリスト Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P02300 - SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems
SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P04100 - SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G03200 - SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン
SEMI G32 - カプセルなし熱抵抗測定用チップのガイドライン Sale priceMember Price: ¥135
Non-Member Price: ¥29,700
E17900 - SEMI E179 - Specification for Protocol Buffers Common Components
SEMI E179 - Specification for Protocol Buffers Common Components Sale price Member Price : ¥113
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G00600 - SEMI G6 - Test Method for Seal Ring Flatness
SEMI G6 - Test Method for Seal Ring Flatness Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
PV09200 - SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules
SEMI PV92 - Test Method for Extension of Flexible Thin Film Photovoltaic (PV) Modules Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M01500 - SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表
SEMI M15 - 半絶縁ガリウムヒ素ウェーハ用の鏡面ウェーハの許容表面欠陥表 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
3D02000 - SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications
SEMI 3D20 - Specification for Panel Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P02500 - SEMI P25 - Specification for Measuring Depth of Focus and Best Focus
SEMI P25 - Specification for Measuring Depth of Focus and Best Focus Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P01700 - SEMI P17 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト・メタルイオンフリー（MIF）現像液における鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，およびニッケルの測定
SEMI P17 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト・メタルイオンフリー（MIF）現像液における鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，およびニッケルの測定 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
G05800 - SEMI G58 - Specification for Cerquad Package Constructions
SEMI G58 - Specification for Cerquad Package Constructions Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F07100 - SEMI F71 - ガス供給システムの温度サイクル試験方法
SEMI F71 - ガス供給システムの温度サイクル試験方法 Regular price¥49,500 JPY Sale price¥38,100 JPY
P01300 - SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy
SEMI P13 - Determination of Sodium and Potassium in Positive Photoresists by Atomic Absorption Spectroscopy Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G03200 - SEMI G32 - Guideline for Unencapsulated Thermal Test Chip
SEMI G32 - Guideline for Unencapsulated Thermal Test Chip Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P02400 - SEMI P24 - CD Metrology Procedures
SEMI P24 - CD Metrology Procedures Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
P01200 - SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定
SEMI P12 - 誘導結合プラズマ発光分光法（ICP）によるポジティブ・フォトレジスト中の鉄，亜鉛，カルシウム，マグネシウム，銅，ホウ素，アルミニウム，クロム，マンガン，及びニッケルの測定 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
P02100 - SEMI P21 - マスク描画装置の精度表示のガイドライン
SEMI P21 - マスク描画装置の精度表示のガイドライン Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
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