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1222 products

E14800 - SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object
SEMI E148 - Specification for Time Synchronization and Definition of the TS-Clock Object Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E16400 - SEMI E164 - Specification for EDA Common Metadata
SEMI E164 - Specification for EDA Common Metadata Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05400 - SEMI D54 - Specification for Substrate Management of FPD Production (SMS-FPD)
SEMI D54 - Specification for Substrate Management of FPD Production (SMS-FPD) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C06900 - SEMI C69 - Test Method for the Determination of Surface Areas of Polymer Pellets
SEMI C69 - Test Method for the Determination of Surface Areas of Polymer Pellets Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05200 - SEMI D52 - 基板IDの基準位置に関する仕様
SEMI D52 - 基板IDの基準位置に関する仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
3D01700 - SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology
SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04700 - SEMI F47 - Specification for Semiconductor Processing Equipment Voltage Sag Immunity
SEMI F47 - Specification for Semiconductor Processing Equipment Voltage Sag Immunity Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
C05900 - SEMI C59 - Specification for Nitrogen
SEMI C59 - Specification for Nitrogen Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E12100 - SEMI E121 - Guide for Style and Usage of XML for Semiconductor Manufacturing Applications
SEMI E121 - Guide for Style and Usage of XML for Semiconductor Manufacturing Applications Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method
SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E15200 - SEMI E152 - Specification for Mechanical Features of EUV Pod for 150 mm EUVL Reticles
SEMI E152 - Specification for Mechanical Features of EUV Pod for 150 mm EUVL Reticles Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C02400 - SEMI C24 - Specification for n-Butyl Acetate
SEMI C24 - Specification for n-Butyl Acetate Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04800 - SEMI F48 - Test Method for Determining Trace Metals in Polymer Materials
SEMI F48 - Test Method for Determining Trace Metals in Polymer Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C08100 - SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS)
SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
3D01300 - SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks
SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05300 - SEMI D53 - Specification for Flat Panel Display (FPD) Pellicles
SEMI D53 - Specification for Flat Panel Display (FPD) Pellicles Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F06200 - SEMI F62 - Test Method for Determining Mass Flow Controller Performance Characteristics for Ambient and Gas Temperature Effects
SEMI F62 - Test Method for Determining Mass Flow Controller Performance Characteristics for Ambient and Gas Temperature Effects Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E02900 - SEMI E29 - Terminology for the Calibration of Mass Flow Controllers and Mass Flow Meters
SEMI E29 - Terminology for the Calibration of Mass Flow Controllers and Mass Flow Meters Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
3D01100 - SEMI 3D11 - Terminology for Through Glass Via and Blind Via in Glass Geometrical Metrology
SEMI 3D11 - Terminology for Through Glass Via and Blind Via in Glass Geometrical Metrology Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D02300 - SEMI D23 - Guide for Cost of Equipment Ownership (CEO) Calculation for FPD Equipment
SEMI D23 - Guide for Cost of Equipment Ownership (CEO) Calculation for FPD Equipment Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C08600 - SEMI C86 - Guide for Ethylene Glycol
SEMI C86 - Guide for Ethylene Glycol Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C08000 - SEMI C80 - Guide for Tetrakis(Dimethylamino) Silane (TDMAS)
SEMI C80 - Guide for Tetrakis(Dimethylamino) Silane (TDMAS) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
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