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1222 products

E17100 - SEMI E171 - Specification for Predictive Carrier Logistics (PCL)
SEMI E171 - Specification for Predictive Carrier Logistics (PCL) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E13000 - SEMI E130 - Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300)
SEMI E130 - Specification for Prober Specific Equipment Model for 300 mm Environment (PSEM300) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05900 - SEMI D59 - Terminology for 3D Display
SEMI D59 - Terminology for 3D Display Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04300 - SEMI F43 - ユースポイントガス精製器およびガスフィルタによるパーティクルに対する寄与度を定量化するための試験方法
SEMI F43 - ユースポイントガス精製器およびガスフィルタによるパーティクルに対する寄与度を定量化するための試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
E05411 - SEMI E54.11 - Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices
SEMI E54.11 - Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F10400 - SEMI F104 - Test Method for Evaluation of Particle Contribution of Components Used in Ultrapure Water and Liquid Chemical Distribution Systems
SEMI F104 - Test Method for Evaluation of Particle Contribution of Components Used in Ultrapure Water and Liquid Chemical Distribution Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F09700 - SEMI F97 - Specification for Facility Package Integration, Monitoring and Control
SEMI F97 - Specification for Facility Package Integration, Monitoring and Control Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05800 - SEMI D58 - Terminology for the Color Breakup of Field Sequential Color Display
SEMI D58 - Terminology for the Color Breakup of Field Sequential Color Display Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E05100 - SEMI E51 - Guide for Typical Facilities Services and Termination Matrix
SEMI E51 - Guide for Typical Facilities Services and Termination Matrix Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E01200 - SEMI E12 - Guide for Standardized Pressure, Temperature, Density, and Flow Units Used in Mass Flow Meters and Mass Flow Controllers
SEMI E12 - Guide for Standardized Pressure, Temperature, Density, and Flow Units Used in Mass Flow Meters and Mass Flow Controllers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F03200 - SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves
SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E09400 - SEMI E94 - Specification for Control Job Management
SEMI E94 - Specification for Control Job Management Sale price Member Price : ¥113
E05700 - SEMI E57 - Specification for Kinematic Couplings Used to Align and Support 300 mm Wafer Carriers
SEMI E57 - Specification for Kinematic Couplings Used to Align and Support 300 mm Wafer Carriers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F04900 - SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity
SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E07600 - SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services
SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E07900 - SEMI E79 - Specification for Definition and Measurement of Equipment Productivity
SEMI E79 - Specification for Definition and Measurement of Equipment Productivity Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E11500 - SEMI E115 - Test Method for Determining the Load Impedance and Efficiency of Matching Networks Used in Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E115 - Test Method for Determining the Load Impedance and Efficiency of Matching Networks Used in Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E02200 - SEMI E22 - Specification for Cluster Tool Module Interface: Transport Module End Effector Exclusion Volume
SEMI E22 - Specification for Cluster Tool Module Interface: Transport Module End Effector Exclusion Volume Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05500 - SEMI D55 - Guide for Evaluation Method of Color Performance for Color Filter Assemblies (Evaluation Method of Color Purity)
SEMI D55 - Guide for Evaluation Method of Color Performance for Color Filter Assemblies (Evaluation Method of Color Purity) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E16900 - SEMI E169 - Guide for Equipment Information System Security
SEMI E169 - Guide for Equipment Information System Security Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E04900 - SEMI E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies
SEMI E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing
SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F07200 - SEMI F72 - Test Method for Auger Electron Spectroscopy (AES) Evaluation of Oxide Layer of Wetted Surfaces of Passivated 316L Stainless Steel Components
SEMI F72 - Test Method for Auger Electron Spectroscopy (AES) Evaluation of Oxide Layer of Wetted Surfaces of Passivated 316L Stainless Steel Components Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D05600 - SEMI D56 - Test Method for Measurement for Ambient Contrast of Liquid Crystal Displays
SEMI D56 - Test Method for Measurement for Ambient Contrast of Liquid Crystal Displays Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
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