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1222 products

M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M04900 - SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations
SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
PV01300 - SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
PV05200 - SEMI PV52 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain Size
SEMI PV52 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers Regarding Grain Size Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E05800 - SEMI E58 - 自動化による信頼性，有用性，および整備性に関するスタンダード（ARAMS）：コンセプト，挙動，およびサービス
SEMI E58 - 自動化による信頼性，有用性，および整備性に関するスタンダード（ARAMS）：コンセプト，挙動，およびサービス Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
E10100 - SEMI E101 - EFEM機能構造モデルのガイド
SEMI E101 - EFEM機能構造モデルのガイド Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
M05900 - SEMI M59 - Terminology for Silicon Technology
SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F05600 - SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers
SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers
SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E11900 - SEMI E119 - Mechanical Specification for Reduced-Pitch Front-Opening Box for Interfactory Transport of 300 mm Wafers
SEMI E119 - Mechanical Specification for Reduced-Pitch Front-Opening Box for Interfactory Transport of 300 mm Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E01501 - SEMI E15.1 - 300 mm装置ロードポートのための仕様
SEMI E15.1 - 300 mm装置ロードポートのための仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
PV07000 - SEMI PV70 - Test Method for In-Line Measurement of Saw Marks on Photovoltaic (PV) Silicon Wafers by Laser Triangulation Sensors
SEMI PV70 - Test Method for In-Line Measurement of Saw Marks on Photovoltaic (PV) Silicon Wafers by Laser Triangulation Sensors Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E16100 - SEMI E161 - Guide for Identification and Classification of Training Tiers
SEMI E161 - Guide for Identification and Classification of Training Tiers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers
SEMI G77 - Specification for Frame Cassette for 300 mm Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
G01000 - SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes
SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M01300 - SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers
SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
HB00400 - SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI)
SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF008100 - SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
M06400 - SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
MF153000 - SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
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