SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

3D01600 - SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging
SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C06900 - SEMI C69 - ポリマーペレットの表面積を測定するための試験方法
SEMI C69 - ポリマーペレットの表面積を測定するための試験方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
C00331 - SEMI C3.31 - Specification for Dichlorosilane (SiH2Cl2) in Cylinders, 99% Quality (Provisional)
E12500 - SEMI E125 - EQUIPMENT SELF DESCRIPTION 사양
SEMI E125 - EQUIPMENT SELF DESCRIPTION 사양 Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F03800 - SEMI F38 - ユースポイントガスフィルタの効率資格付けを目的とした試験方法
E05700 - SEMI E57 - 300 mmウェーハキャリアの位置決めおよび支持のために使用されるキネマティックカプリングの機械仕様
E15200 - SEMI E152 - 150 mm EUVLレチクル用EUVポッドの機械仕様
SEMI E152 - 150 mm EUVLレチクル用EUVポッドの機械仕様 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
D01000 - SEMI D10 - FPD用ガラス基板の耐薬品性テスト方法
SEMI D10 - FPD用ガラス基板の耐薬品性テスト方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
D04000 - SEMI D40 - Terminology for FPD Substrate Deflection
SEMI D40 - Terminology for FPD Substrate Deflection Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F07200 - SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法(AES)による評価テスト方法
C01000 - SEMI C10 - Guide for Determination of Method Detection Limits
SEMI C10 - Guide for Determination of Method Detection Limits Sale priceMember Price: ¥225
Non-Member Price: ¥62,700
C06700 - SEMI C67 - Guide for Hafnium Amides
SEMI C67 - Guide for Hafnium Amides Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00332 - SEMI C3.32 - Specification for Chlorine (Cl2), 99.996% Quality
SEMI C3.32 - Specification for Chlorine (Cl2), 99.996% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C05100 - SEMI C51 - Specification for Xylenes
SEMI C51 - Specification for Xylenes Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
3D01800 - SEMI 3D18 - Guide for Wafer Edge Trimming for 3DS-IC Process
SEMI 3D18 - Guide for Wafer Edge Trimming for 3DS-IC Process Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C09000 - SEMI C90 - Specification for Perfluoroalkoxy Alkane (PFA) and Other Fluorinated Materials Used In Liquid Chemical Distribution Systems
C09500 - SEMI C95 - Guide for Pentakis Dimethylamino Tantalum
SEMI C95 - Guide for Pentakis Dimethylamino Tantalum Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C05400 - SEMI C54 - Specification for Oxygen (O2)
SEMI C54 - Specification for Oxygen (O2) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D03000 - SEMI D30 - Test Method for Light Resistance in Flat Panel Display (FPD) Color Filters
C00322 - SEMI C3.22 - Standard for Oxygen (O2), 99.5% Quality
SEMI C3.22 - Standard for Oxygen (O2), 99.5% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C00341 - SEMI C3.41 - Standard for Oxygen (O2), Bulk, 99.9998% Quality
SEMI C3.41 - Standard for Oxygen (O2), Bulk, 99.9998% Quality Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
World Fab Watch - Single Edition
World Fab Watch Single Edition Sale priceMember Price: ¥2,150
Non-Member Price: ¥717,000
D03600 - SEMI D36 - Terminology for LCD Backlight Unit
SEMI D36 - Terminology for LCD Backlight Unit Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
C04900 - SEMI C49 - Guide for Trimethylborate
SEMI C49 - Guide for Trimethylborate Sale priceMember Price: ¥113
Non-Member Price: ¥31,900