SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

Filters

Sort by:

1910 products

D06900 - SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses
SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E13400 - SEMI E134 - 데이터 수집 관리 사양
SEMI E134 - 데이터 수집 관리 사양 Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E05422 - SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges
SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E03500 - SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Historical Book-to-Bill Report (1991-2016) and Billings Report (1991-2025)
Historical Book-to-Bill Report (1991-2016) and Billings Report (19912025) Sale priceMember Price: ¥1,150
Non-Member Price: ¥412,400
E12000 - SEMI E120 - Specification for the Common Equipment Model (CEM)
SEMI E120 - Specification for the Common Equipment Model (CEM) Sale price Member Price : ¥113
E08700 - SEMI E87 - Specification for Carrier Management (CMS)
SEMI E87 - Specification for Carrier Management (CMS) Sale price Member Price : ¥113
F01900 - SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components
SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D06500 - SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display
SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling Regular price¥49,500 JPY Sale price¥31,900 JPY
F02800 - SEMI F28 - プロセスパネルからのパーティクル発生を測定するテスト方法
SEMI F28 - プロセスパネルからのパーティクル発生を測定するテスト方法 Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
D00600 - SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates
SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price¥49,500 JPY Sale price¥31,900 JPY
Worldwide Assembly & Test Facility Database (IDM + OSAT)
Worldwide Assembly & Test Facility Database (IDM + OSAT) Sale priceMember Price: ¥7,000
Non-Member Price: ¥1,814,200
F07700 - SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems
SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E06700 - SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller
SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E01900 - SEMI E19 - Specification for Standard Mechanical Interface (SMIF)
SEMI E19 - Specification for Standard Mechanical Interface (SMIF) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E02100 - SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport
SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
D06700 - SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials
SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E12900 - SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility
SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E13300 - SEMI E133 - Specification for Automated Process Control Systems Interface
SEMI E133 - Specification for Automated Process Control Systems Interface Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E09200 - SEMI E92 - Specification for 300 mm Light Weight and Compact Box Opener/Loader to Tool-Interoperability Standard (Bolts/Light)
SEMI E92 - Specification for 300 mm Light Weight and Compact Box Opener/Loader to Tool-Interoperability Standard (Bolts/Light) Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
E11400 - SEMI E114 - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E114 - Test Method for RF Cable Assemblies Used in Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: ¥113
Non-Member Price: ¥31,900