Japan Store
Products
Filters
1910 products
SEMI P21 - マスク描画装置の精度表示のガイドライン
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P22 - Guideline for Photomask Defect Classification and Size Definition
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P22 - フォトマスク欠陥の分類とサイズ定義についてのガイドライン
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P23 - Guidelines for Programmed Defect Masks and Benchmark Procedures for Sensitivity Analysis of Mask Defect Inspection Systems
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P24 - CD Metrology Procedures
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P24 - CD測長手順
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P25 - Specification for Measuring Depth of Focus and Best Focus
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P25 - 焦点深度および最適焦点深度（仕様）
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P26 - Parameter Checklist for Photoresist Sensitivity Measurement
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P26 - フォトレジストの感度測定用パラメータチェックリスト
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P27 - Parameter Checklist for Resist Thickness Measurement on a Substrate
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P27 - 基板上のレジスト膜厚の測定用パラメータチェックリスト
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P28 - Specification for Overlay-Metrology Test Patterns for Integrated-Circuit Manufacture
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P28 - 集積回路製造用オーバーレイ計測テストパターン
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P29 - Specification for Characteristics Specific to Attenuated Phase Shift Masks and Masks Blanks
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P29 - 減衰型位相シフトマスク（ハーフトーン型位相シフトマスク）およびマスクブランクスに特有な特性の仕様
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P30 - Practice for Catalog Publication of Critical Dimension Measurement Scanning Electron Microscopes (CD-SEM)
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P30 - 寸法測定用走査型電子顕微鏡（CD-SEM）の目録発行の実施要領
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P31 - Practice for Catalog Publication for Chemical Amplified (CA) Photoresist Parameter
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P31 - 化学増幅型（CA）フォトレジストパラメータのカタログ発行の作業方法
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P32 - Test Method for Determination of Trace Metals in Photoresist
Sale priceMember Price: ¥113
Non-Member Price: ¥31,900
Non-Member Price: ¥31,900
SEMI P32 - フォトレジスト中のトレースメタル定量のための試験方法
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100
SEMI P34 - 230mm方形フォトマスク基板の仕様
Sale priceMember Price: ¥135
Non-Member Price: ¥38,100
Non-Member Price: ¥38,100