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D08000 - SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time
D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays
SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock
PV08800 - SEMI PV88 - 惰性气体熔融红外吸收法测定光伏多晶硅中氢含量的测试方法
A00400 - SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS)
MS01300 - SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process
G00300 - SEMI G3 - Specification for Sidebrazed Laminates
SEMI G3 - Specification for Sidebrazed Laminates Sale priceMember Price: $113.00
Non-Member Price: $193.00
G05300 - SEMI G53 - Specification for Metal Lid/Preform Assembly
SEMI G53 - Specification for Metal Lid/Preform Assembly Sale priceMember Price: $113.00
Non-Member Price: $193.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
G03900 - SEMI G39 - Specification for Brazed Lead Flatpack Constructions, Including Leadframes, Suitable for Automated Assembly
HB01300 - SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
P03600 - SEMI P36 - 測長走査型電子顕微鏡(CD-SEM)用倍率標準試料のガイド
SEMI P36 - 測長走査型電子顕微鏡(CD-SEM)用倍率標準試料のガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
C09900 - SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
G06100 - SEMI G61 - Specification for Cofired Ceramic Packages
SEMI G61 - Specification for Cofired Ceramic Packages Sale priceMember Price: $113.00
Non-Member Price: $150.00
C09800 - SEMI C98 - Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing
P04000 - SEMI P40 - 極紫外線リソグラフィマスクの取り付けに関する要求条件およびアライメント基準位置の仕様
F11600 - SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse
T01600 - SEMI T16 - 極紫外線マスク自動識別用データマトリクス記号法適用の仕様
G00300 - SEMI G3 - 仕様 側面ろう付け積層板
SEMI G3 - 仕様 側面ろう付け積層板 Sale priceMember Price: $135.00
Non-Member Price: $231.00
PV02200 - SEMI PV22 - 太陽光電池用シリコンウェーハの仕様
SEMI PV22 - 太陽光電池用シリコンウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb)
SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: $113.00
Non-Member Price: $193.00
T01200 - SEMI T12 - Specification for Tracing Jigs and Implements
SEMI T12 - Specification for Tracing Jigs and Implements Sale priceMember Price: $225.00
Non-Member Price: $380.00
P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様
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