SEMI 3D8 - Guide for Describing Silicon Wafers for Use as 300 mm Carri – Page 79

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M00100 - SEMI M1 - Specification for Polished Single Crystal Silicon Wafers

SEMI M1 - Specification for Polished Single Crystal Silicon Wafers

Member Price: $225.00
Non-Member Price: $380.00

M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces

SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces

Member Price: $113.00
Non-Member Price: $193.00

M04900 - SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations

SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations

Member Price: $113.00
Non-Member Price: $193.00

MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

Member Price: $113.00
Non-Member Price: $193.00

M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers

SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers

Member Price: $113.00
Non-Member Price: $193.00

M05900 - SEMI M59 - Terminology for Silicon Technology

SEMI M59 - Terminology for Silicon Technology

Member Price: $113.00
Non-Member Price: $193.00

F05600 - SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers

SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers

Member Price: $113.00
Non-Member Price: $193.00

MF139000 - SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning

SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning

Member Price: $113.00
Non-Member Price: $193.00

M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI

Member Price: $113.00
Non-Member Price: $193.00

MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe

SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe

Member Price: $113.00
Non-Member Price: $193.00

M01300 - SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers

SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers

Member Price: $113.00
Non-Member Price: $193.00

G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers

SEMI G77 - Specification for Frame Cassette for 300 mm Wafers

Member Price: $113.00
Non-Member Price: $193.00

G01000 - SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes

SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes

Member Price: $113.00
Non-Member Price: $193.00

MF008100 - SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers

SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers

Member Price: $113.00
Non-Member Price: $193.00

MF153000 - SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning

SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning

Member Price: $113.00
Non-Member Price: $193.00