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D04500 - SEMI D45 - 平面顯示器彩色濾光片所使用,含高阻值之樹脂型黑色矩陣電阻的量測方法
F03000 - SEMI F30 - 据付現場における微量ガス不純物およびパーティクルに関する精製器性能テストの始動および検証
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
P00200 - SEMI P2 - ハードサーフェス・フォトマスク用クロムブランク
SEMI P2 - ハードサーフェス・フォトマスク用クロムブランク Sale priceMember Price: $135.00
Non-Member Price: $231.00
G08100 - SEMI G81 - マップデータ・アイテムの仕様
SEMI G81 - マップデータ・アイテムの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01500 - SEMI P15 - Determination of Sodium and Potassium in Positive Photoresist Metal Ion Free (MIF) Developers by Atomic Absorption Spectroscopy
P01200 - SEMI P12 - Determination of Iron, Zinc, Calcium, Magnesium, Copper, Boron, Aluminum, Chromium, Manganese, and Nickel in Positive Photoresists by Inductively Coupled Plasma Emission Spectroscopy (ICP)
M02200 - SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers
SEMI M22 - Specification for Dielectrically Isolated (DI) Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
P01500 - SEMI P15 - 原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー(MIF)現像液中のナトリウムとカリウムの測定
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P00200 - SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks
SEMI P2 - Specification for Chrome Thin Films for Hard Surface Photomasks Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07100 - SEMI G71 - パッケージング材料の中間容器のバーコードマーキングの仕様
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
G08800 - SEMI G88 - 450mmウェーハ用テープフレームの仕様
SEMI G88 - 450mmウェーハ用テープフレームの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C00347 - SEMI C3.47 - 臭化水素(HBr),品質99.98%の仕様
SEMI C3.47 - 臭化水素(HBr),品質99.98%の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G07600 - SEMI G76 - Specification for Polyimide-Based Adhesive Tape Used in Tape Carrier Packages (TCP)
P03400 - SEMI P34 - Specification for 230 mm Square Photomask Substrates
SEMI P34 - Specification for 230 mm Square Photomask Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00327 - SEMI C3.27 - 三フッ化ホウ素(BF3),シリンダ充填, 99.0%品質の仕様
C00355 - SEMI C3.55 - シラン(SiH4),バルク,品質99.994%の仕様
SEMI C3.55 - シラン(SiH4),バルク,品質99.994%の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G07800 - SEMI G78 - Test Method for Comparing Automated Wafer Probe Systems Utilizing Process-Specific Measurements
C00300 - SEMI C3 - ガスの仕様
SEMI C3 - ガスの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C02900 - SEMI C29 - 4.9%フッ化ケイ素酸(10:1 V/V)の仕様とガイドライン
SEMI C29 - 4.9%フッ化ケイ素酸(10:1 V/V)の仕様とガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01400 - SEMI P14 - Determination of Tin in Positive Photoresists by Graphite Furnace Atomic Absorption Spectroscopy
P02300 - SEMI P23 - プログラム欠陥マスクおよびマスク欠陥検査システムの感度分析ベンチマーク手順についてのガイドライン
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