Individual Standards

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1222 products

E17400 - SEMI E174 - Specification for Wafer Job Management (WJM)
SEMI E174 - Specification for Wafer Job Management (WJM) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E16500 - SEMI E165 - Guide for a Comprehensive Equipment Training System When Dedicated Training Equipment is not Available
SEMI E165 - Guide for a Comprehensive Equipment Training System When Dedicated Training Equipment is not Available Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05419 - SEMI E54.19 - Specification for Sensor/Actuator Network for MECHATROLINK
SEMI E54.19 - Specification for Sensor/Actuator Network for MECHATROLINK Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12300 - SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM)
SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E03000 - SEMI E30 - Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM)
SEMI E30 - Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM) Sale price Member Price : $225.00
D06900 - SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses
SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses Sale priceMember Price: $113.00
Non-Member Price: $193.00
E13400 - SEMI E134 - 데이터 수집 관리 사양
SEMI E134 - 데이터 수집 관리 사양 Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05422 - SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges
SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges Sale priceMember Price: $113.00
Non-Member Price: $193.00
E03500 - SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment Sale priceMember Price: $113.00
Non-Member Price: $193.00
E08700 - SEMI E87 - Specification for Carrier Management (CMS)
SEMI E87 - Specification for Carrier Management (CMS) Sale price Member Price : $113.00
E12000 - SEMI E120 - Specification for the Common Equipment Model (CEM)
SEMI E120 - Specification for the Common Equipment Model (CEM) Sale price Member Price : $113.00
F01900 - SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components
SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
D06500 - SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display
SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display Sale priceMember Price: $113.00
Non-Member Price: $193.00
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling Regular price$300.00 USD Sale price$193.00 USD
D00600 - SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates
SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price$300.00 USD Sale price$193.00 USD
F07700 - SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems
SEMI F77 - Test Method for Electrochemical Critical Pitting Temperature Testing of Stainless Steel Surfaces Used in Corrosive Gas Systems Sale priceMember Price: $113.00
Non-Member Price: $193.00
E06700 - SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller
SEMI E67 - Test Method for Determining Reliability of Mass Flow Controller Sale priceMember Price: $113.00
Non-Member Price: $193.00
E01900 - SEMI E19 - Specification for Standard Mechanical Interface (SMIF)
SEMI E19 - Specification for Standard Mechanical Interface (SMIF) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E02100 - SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport
SEMI E21 - Specification for Cluster Tool Module Interface: Mechanical Interface and Wafer Transport Sale priceMember Price: $113.00
Non-Member Price: $193.00
D06700 - SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials
SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12900 - SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility
SEMI E129 - Guide to Assess and Control Electrostatic Charge in a Semiconductor Manufacturing Facility Sale priceMember Price: $113.00
Non-Member Price: $193.00
E13300 - SEMI E133 - Specification for Automated Process Control Systems Interface
SEMI E133 - Specification for Automated Process Control Systems Interface Sale priceMember Price: $113.00
Non-Member Price: $193.00
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves Sale priceMember Price: $113.00
Non-Member Price: $193.00
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