SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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E09400 - SEMI E94 - コントロールジョブ管理(CJM)の仕様
SEMI E94 - コントロールジョブ管理(CJM)の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C00354 - SEMI C3.54 - シラン(SiH4)のガス純度ガイドライン
SEMI C3.54 - シラン(SiH4)のガス純度ガイドライン Sale priceMember Price: $135.00
Non-Member Price: $231.00
C06900 - SEMI C69 - Test Method for the Determination of Surface Areas of Polymer Pellets
SEMI C69 - Test Method for the Determination of Surface Areas of Polymer Pellets Sale priceMember Price: $113.00
Non-Member Price: $193.00
D01900 - SEMI D19 - FPD用カラーフィルタの耐薬品性試験方法
SEMI D19 - FPD用カラーフィルタの耐薬品性試験方法 Sale priceMember Price: $113.00
Non-Member Price: $231.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $113.00
Non-Member Price: $193.00
D05400 - SEMI D54 - Specification for Substrate Management of FPD Production (SMS-FPD)
SEMI D54 - Specification for Substrate Management of FPD Production (SMS-FPD) Sale priceMember Price: $113.00
Non-Member Price: $193.00
C08800 - SEMI C88 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
3D01700 - SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology
SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology Sale priceMember Price: $113.00
Non-Member Price: $193.00
D05200 - SEMI D52 - 基板IDの基準位置に関する仕様
SEMI D52 - 基板IDの基準位置に関する仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F04700 - SEMI F47 - Specification for Semiconductor Processing Equipment Voltage Sag Immunity
SEMI F47 - Specification for Semiconductor Processing Equipment Voltage Sag Immunity Sale priceMember Price: $225.00
Non-Member Price: $380.00
C00351 - SEMI C3.51 - Specification for Boron Trichloride (BCl3), 99.98% Quality
SEMI C3.51 - Specification for Boron Trichloride (BCl3), 99.98% Quality Sale priceMember Price: $113.00
Non-Member Price: $193.00
C05900 - SEMI C59 - Specification for Nitrogen
SEMI C59 - Specification for Nitrogen Sale priceMember Price: $113.00
Non-Member Price: $193.00
C00606 - SEMI C6.6 - パイプラインガスとして授受されるグレード10/0.1窒素(N2)およびアルゴン(Ar)に対するパーティクル仕様
E12100 - SEMI E121 - Guide for Style and Usage of XML for Semiconductor Manufacturing Applications
D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method
E15200 - SEMI E152 - Specification for Mechanical Features of EUV Pod for 150 mm EUVL Reticles
SEMI E152 - Specification for Mechanical Features of EUV Pod for 150 mm EUVL Reticles Sale priceMember Price: $113.00
Non-Member Price: $193.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
F04800 - SEMI F48 - Test Method for Determining Trace Metals in Polymer Materials
SEMI F48 - Test Method for Determining Trace Metals in Polymer Materials Sale priceMember Price: $113.00
Non-Member Price: $193.00
C02400 - SEMI C24 - Specification for n-Butyl Acetate
SEMI C24 - Specification for n-Butyl Acetate Sale priceMember Price: $113.00
Non-Member Price: $193.00
C08100 - SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS)
SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS) Sale priceMember Price: $113.00
Non-Member Price: $193.00
3D01300 - SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks
SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks Sale priceMember Price: $113.00
Non-Member Price: $193.00
D05300 - SEMI D53 - Specification for Flat Panel Display (FPD) Pellicles
SEMI D53 - Specification for Flat Panel Display (FPD) Pellicles Sale priceMember Price: $113.00
Non-Member Price: $193.00
E02900 - SEMI E29 - Terminology for the Calibration of Mass Flow Controllers and Mass Flow Meters
F06200 - SEMI F62 - Test Method for Determining Mass Flow Controller Performance Characteristics for Ambient and Gas Temperature Effects