SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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D00700 - SEMI D7 - FPD用ガラス基板の表面粗さの測定方法
SEMI D7 - FPD用ガラス基板の表面粗さの測定方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E08400 - SEMI E84 - Specification for Enhanced Carrier Handoff Parallel I/O Interface
SEMI E84 - Specification for Enhanced Carrier Handoff Parallel I/O Interface Sale priceMember Price: $225.00
Non-Member Price: $380.00
F06800 - SEMI F68 - Test Method for Determining Purifier Efficiency
SEMI F68 - Test Method for Determining Purifier Efficiency Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12600 - SEMI E126 - Specification for Equipment Quality Information Parameters (EQIP)
SEMI E126 - Specification for Equipment Quality Information Parameters (EQIP) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E15000 - SEMI E150 - Guide for Equipment Training Best Practices
SEMI E150 - Guide for Equipment Training Best Practices Sale priceMember Price: $113.00
Non-Member Price: $193.00
F03600 - SEMI F36 - Guide for Dimensions and Connections of Gas Distribution Components
SEMI F36 - Guide for Dimensions and Connections of Gas Distribution Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
E17400 - SEMI E174 - Specification for Wafer Job Management (WJM)
SEMI E174 - Specification for Wafer Job Management (WJM) Sale priceMember Price: $113.00
Non-Member Price: $193.00
F07300 - SEMI F73 - Test Method for Scanning Electron Microscopy (SEM) Evaluation of Wetted Surface Condition of Stainless Steel Components
SEMI F73 - Test Method for Scanning Electron Microscopy (SEM) Evaluation of Wetted Surface Condition of Stainless Steel Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
E16500 - SEMI E165 - Guide for a Comprehensive Equipment Training System When Dedicated Training Equipment is not Available
SEMI E165 - Guide for a Comprehensive Equipment Training System When Dedicated Training Equipment is not Available Sale priceMember Price: $113.00
Non-Member Price: $193.00
F07300 - SEMI F73 - ステンレス鋼部品の接ガス表面状態の走査型電子顕微鏡（SEM）による評価テスト方法
SEMI F73 - ステンレス鋼部品の接ガス表面状態の走査型電子顕微鏡（SEM）による評価テスト方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E05419 - SEMI E54.19 - Specification for Sensor/Actuator Network for MECHATROLINK
SEMI E54.19 - Specification for Sensor/Actuator Network for MECHATROLINK Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12300 - SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM)
SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E03000 - SEMI E30 - Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM)
SEMI E30 - Specification for the Generic Model for Communications and Control of Manufacturing Equipment (GEM) Sale price Member Price : $225.00
D06600 - SEMI D66 - フレキシブルディスプレイ用プラスチック基板の用語
SEMI D66 - フレキシブルディスプレイ用プラスチック基板の用語 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D06900 - SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses
SEMI D69 - Test Method of FPD-Based Stereoscopic Display with Active Glasses Sale priceMember Price: $113.00
Non-Member Price: $193.00
E13400 - SEMI E134 - 데이터 수집 관리 사양
SEMI E134 - 데이터 수집 관리 사양 Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05422 - SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges
SEMI E54.22 - Specification for Sensor/Actuator Network Specific Device Model for Vacuum Pressure Gauges Sale priceMember Price: $113.00
Non-Member Price: $193.00
E03500 - SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment
SEMI E35 - Guide to Calculate Cost of Ownership (COO) Metrics for Semiconductor Manufacturing Equipment Sale priceMember Price: $113.00
Non-Member Price: $193.00
Historical Book-to-Bill Report (1991-2016) and Billings Report (1991-2025)
Historical Book-to-Bill Report (1991-2016) and Billings Report (19912025) Sale priceMember Price: $1,150.00
Non-Member Price: $2,500.00
E08700 - SEMI E87 - Specification for Carrier Management (CMS)
SEMI E87 - Specification for Carrier Management (CMS) Sale price Member Price : $113.00
E12000 - SEMI E120 - Specification for the Common Equipment Model (CEM)
SEMI E120 - Specification for the Common Equipment Model (CEM) Sale price Member Price : $113.00
F01900 - SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components
SEMI F19 - Specification for the Surface Condition of the Wetted Surfaces of Stainless Steel Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
D06500 - SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display
SEMI D65 - Test Method for Measurement for the Color Breakup of Field Sequential Color Display Sale priceMember Price: $113.00
Non-Member Price: $193.00
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling Regular price$300.00 USD Sale price$193.00 USD