SEMI 3D14 - Guide for Incoming/Outgoing Quality control and Testing Flow for 3DS-IC Products

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PV06600 - SEMI PV66 - 太阳能电池电极栅线高宽比测试：激光扫描共聚焦显微镜法
SEMI PV66 - 太阳能电池电极栅线高宽比测试：激光扫描共聚焦显微镜法 Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05800 - SEMI E58 - 自動化による信頼性，有用性，および整備性に関するスタンダード（ARAMS）：コンセプト，挙動，およびサービス
SEMI E58 - 自動化による信頼性，有用性，および整備性に関するスタンダード（ARAMS）：コンセプト，挙動，およびサービス Sale priceMember Price: $135.00
Non-Member Price: $231.00
E10100 - SEMI E101 - EFEM機能構造モデルのガイド
SEMI E101 - EFEM機能構造モデルのガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe Sale priceMember Price: $113.00
Non-Member Price: $193.00
M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers
SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
F05600 - SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers
SEMI F56 - Test Method for Determining Steady-State Supply Voltage Effects for Mass Flow Controllers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M05900 - SEMI M59 - Terminology for Silicon Technology
SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: $113.00
Non-Member Price: $193.00
E11900 - SEMI E119 - Mechanical Specification for Reduced-Pitch Front-Opening Box for Interfactory Transport of 300 mm Wafers
SEMI E119 - Mechanical Specification for Reduced-Pitch Front-Opening Box for Interfactory Transport of 300 mm Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV07000 - SEMI PV70 - Test Method for In-Line Measurement of Saw Marks on Photovoltaic (PV) Silicon Wafers by Laser Triangulation Sensors
SEMI PV70 - Test Method for In-Line Measurement of Saw Marks on Photovoltaic (PV) Silicon Wafers by Laser Triangulation Sensors Sale priceMember Price: $113.00
Non-Member Price: $193.00
E01501 - SEMI E15.1 - 300 mm装置ロードポートのための仕様
SEMI E15.1 - 300 mm装置ロードポートのための仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E16100 - SEMI E161 - Guide for Identification and Classification of Training Tiers
SEMI E161 - Guide for Identification and Classification of Training Tiers Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe Sale priceMember Price: $113.00
Non-Member Price: $193.00
G07700 - SEMI G77 - Specification for Frame Cassette for 300 mm Wafers
SEMI G77 - Specification for Frame Cassette for 300 mm Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M01300 - SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers
SEMI M13 - Specification for Alphanumeric Marking of Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G01000 - SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes
SEMI G10 - Standard Method for Mechanical Measurement of Plastic Package Leadframes Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF008100 - SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
HB00400 - SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI)
SEMI HB4 - Specification of Communication Interfaces for High Brightness LED Manufacturing Equipment (HB-LED ECI) Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $113.00
Non-Member Price: $193.00
M06400 - SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF153000 - SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1530 - Test Method for Measuring Flatness, Thickness, and Total Thickness Variation on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: $113.00
Non-Member Price: $193.00
M07800 - SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing
SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $113.00
Non-Member Price: $193.00
G08300 - SEMI G83 - Specification for Bar Code Marking of Product Packages
SEMI G83 - Specification for Bar Code Marking of Product Packages Sale priceMember Price: $113.00
Non-Member Price: $193.00
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00