SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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E05411 - SEMI E54.11 - エンドポイントデバイスのための特定デバイスモデル
SEMI E54.11 - エンドポイントデバイスのための特定デバイスモデル Sale priceMember Price: $135.00
Non-Member Price: $231.00
D05500 - SEMI D55 - Guide for Evaluation Method of Color Performance for Color Filter Assemblies (Evaluation Method of Color Purity)
SEMI D55 - Guide for Evaluation Method of Color Performance for Color Filter Assemblies (Evaluation Method of Color Purity) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E16900 - SEMI E169 - Guide for Equipment Information System Security
SEMI E169 - Guide for Equipment Information System Security Sale priceMember Price: $113.00
Non-Member Price: $193.00
E02200 - SEMI E22 - Specification for Cluster Tool Module Interface: Transport Module End Effector Exclusion Volume
SEMI E22 - Specification for Cluster Tool Module Interface: Transport Module End Effector Exclusion Volume Sale priceMember Price: $113.00
Non-Member Price: $193.00
E04900 - SEMI E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies
SEMI E49 - Guide for High Purity and Ultrahigh Purity Piping Performance, Subassemblies, and Final Assemblies Sale priceMember Price: $225.00
Non-Member Price: $380.00
F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing
SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing Sale priceMember Price: $113.00
Non-Member Price: $193.00
F07200 - SEMI F72 - Test Method for Auger Electron Spectroscopy (AES) Evaluation of Oxide Layer of Wetted Surfaces of Passivated 316L Stainless Steel Components
SEMI F72 - Test Method for Auger Electron Spectroscopy (AES) Evaluation of Oxide Layer of Wetted Surfaces of Passivated 316L Stainless Steel Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
D05600 - SEMI D56 - Test Method for Measurement for Ambient Contrast of Liquid Crystal Displays
SEMI D56 - Test Method for Measurement for Ambient Contrast of Liquid Crystal Displays Sale priceMember Price: $113.00
Non-Member Price: $193.00
Material Market Data Subscription (MMDS)
Material Market Data Subscription (MMDS) Sale priceMember Price: $3,750.00
Non-Member Price: $9,850.00
E13400 - SEMI E134 - Specification for Data Collection Management
SEMI E134 - Specification for Data Collection Management Sale price Member Price : $113.00
F07900 - SEMI F79 - Guide for Gas Compatibility with Silicon Used in Gas Distribution Components
SEMI F79 - Guide for Gas Compatibility with Silicon Used in Gas Distribution Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12800 - SEMI E128 - Specification for XML Message Structures
SEMI E128 - Specification for XML Message Structures Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05418 - SEMI E54.18 - 真空ポンプ機器専用のセンサ／アクチュエータネットワークのデバイスモデルの仕様
SEMI E54.18 - 真空ポンプ機器専用のセンサ／アクチュエータネットワークのデバイスモデルの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E04300 - SEMI E43 - Guide for Electrostatic Measurements on Objects and Surfaces
SEMI E43 - Guide for Electrostatic Measurements on Objects and Surfaces Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05412 - SEMI E54.12 - CC-LINK のためのセンサ／アクチュエータ・ネットワーク通信に関する仕様
SEMI E54.12 - CC-LINK のためのセンサ／アクチュエータ・ネットワーク通信に関する仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
E14500 - SEMI E145 - Classification for Measurement Unit Symbols in XML
SEMI E145 - Classification for Measurement Unit Symbols in XML Sale priceMember Price: $113.00
Non-Member Price: $193.00
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $113.00
Non-Member Price: $193.00
E00500 - SEMI E5 - Specification for SEMI Equipment Communications Standard 2 Message Content (SECS-II)
SEMI E5 - Specification for SEMI Equipment Communications Standard 2 Message Content (SECS-II) Sale price Member Price : $225.00
E07800 - SEMI E78 - Guide to Assess and Control Electrostatic Discharge (ESD) and Electrostatic Attraction (ESA) for Equipment
SEMI E78 - Guide to Assess and Control Electrostatic Discharge (ESD) and Electrostatic Attraction (ESA) for Equipment Sale priceMember Price: $113.00
Non-Member Price: $193.00
E05417 - SEMI E54.17 - Specification of Sensor/Actuator Network for A-LINK
SEMI E54.17 - Specification of Sensor/Actuator Network for A-LINK Sale priceMember Price: $113.00
Non-Member Price: $193.00
E12900 - SEMI E129 - 半導体製造設備における静電気放電（ESD）の評価と制御へのガイド
SEMI E129 - 半導体製造設備における静電気放電（ESD）の評価と制御へのガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
E05410 - SEMI E54.10 - Specification for Sensor/Actuator Network Specific Device Model for an In-Situ Particle Monitor Device
SEMI E54.10 - Specification for Sensor/Actuator Network Specific Device Model for an In-Situ Particle Monitor Device Sale priceMember Price: $113.00
Non-Member Price: $193.00
E17600 - SEMI E176 - Guide to Assess and Minimize Electromagnetic Interference (EMI) in a Semiconductor Manufacturing Environment
SEMI E176 - Guide to Assess and Minimize Electromagnetic Interference (EMI) in a Semiconductor Manufacturing Environment Sale priceMember Price: $113.00
Non-Member Price: $193.00
F11200 - SEMI F112 - Test Method for Determination of Moisture Dry-Down Characteristics of Surface-Mounted and Conventional Gas Delivery Systems by Cavity Ring Down Spectroscopy (CRDS)
SEMI F112 - Test Method for Determination of Moisture Dry-Down Characteristics of Surface-Mounted and Conventional Gas Delivery Systems by Cavity Ring Down Spectroscopy (CRDS) Sale priceMember Price: $113.00
Non-Member Price: $193.00