SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

G09000 - SEMI G90 - Specification for 300 mm Wafer Coin-Stack Type Shipping Container Used for Test and Packaging Processes
SEMI G90 - Specification for 300 mm Wafer Coin-Stack Type Shipping Container Used for Test and Packaging Processes Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques Sale priceMember Price: $113.00
Non-Member Price: $193.00
G06400 - SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)
SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E04100 - SEMI E41 - 例外処理スタンダード
SEMI E41 - 例外処理スタンダード Sale priceMember Price: $135.00
Non-Member Price: $231.00
PV03700 - SEMI PV37 - Guide for Fluorine (F2), Used in Photovoltaic Applications
SEMI PV37 - Guide for Fluorine (F2), Used in Photovoltaic Applications Sale priceMember Price: $113.00
Non-Member Price: $193.00
M08000 - SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers
SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G04300 - SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法
SEMI G43 - プラスチックモールドパッケージのジャンクション部とケース間の熱抵抗のための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F08100 - SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications
SEMI F81 - Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Manufacturing Applications Sale priceMember Price: $225.00
Non-Member Price: $380.00
F04000 - SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing
SEMI F40 - Practice for Preparing Liquid Chemical Distribution Components and Neat Polymers for Chemical Testing Sale priceMember Price: $113.00
Non-Member Price: $193.00
F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers Sale priceMember Price: $113.00
Non-Member Price: $193.00
HB00900 - SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED
SEMI HB9 - Test Method and Acceptance Criteria for Visual Inspection of Surface Defects of GaN Epitaxial Wafers Used for Manufacturing HB-LED Sale priceMember Price: $113.00
Non-Member Price: $193.00
E10100 - SEMI E101 - Guide for EFEM Functional Structure Model
SEMI E101 - Guide for EFEM Functional Structure Model Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV05900 - SEMI PV59 - 感应炉内燃烧后红外吸收法测定硅粉中总碳含量的测试方法
SEMI PV59 - 感应炉内燃烧后红外吸收法测定硅粉中总碳含量的测试方法 Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02800 - SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様
SEMI G28 - プラスチックモールドS.O.パッケージのリードフレームのための仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M06300 - SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction
SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry Sale priceMember Price: $113.00
Non-Member Price: $193.00
M05900 - SEMI M59 - シリコン技術の用語集
SEMI M59 - シリコン技術の用語集 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers
SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF145100 - SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: $113.00
Non-Member Price: $193.00
M07700 - SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA
SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA Sale priceMember Price: $113.00
Non-Member Price: $193.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers
SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV08000 - SEMI PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic and Perovskite Solar Cell (PSC)
SEMI PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic and Perovskite Solar Cell (PSC) Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV00200 - SEMI PV2 - PV製造装置通信インタフェース(PVECI)
SEMI PV2 - PV製造装置通信インタフェース(PVECI) Sale priceMember Price: $135.00
Non-Member Price: $231.00