SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

D03000 - SEMI D30 - FPDカラーフィルタの耐光性試験方法
SEMI D30 - FPDカラーフィルタの耐光性試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M01000 - SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称
SEMI M10 - ガリウムヒ素ウェーハに見られる構造及び特徴の確認のための標準名称 Sale priceMember Price: $135.00
Non-Member Price: $231.00
D08000 - SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time
SEMI D80 - Test Method for Measurement of Water Vapor Transmission Rate for High Gas Barrier Plastic Film in a Short Time Sale priceMember Price: $113.00
Non-Member Price: $193.00
G00300 - SEMI G3 - Specification for Sidebrazed Laminates
SEMI G3 - Specification for Sidebrazed Laminates Sale priceMember Price: $113.00
Non-Member Price: $193.00
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock
SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock Sale priceMember Price: $113.00
Non-Member Price: $193.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $113.00
Non-Member Price: $193.00
G05300 - SEMI G53 - Specification for Metal Lid/Preform Assembly
SEMI G53 - Specification for Metal Lid/Preform Assembly Sale priceMember Price: $113.00
Non-Member Price: $193.00
Electronic Design Market Data (EDMD) - Single Edition
Electronic Design Market Data (EDMD) Single Edition Sale priceMember Price: $2,750.00
Non-Member Price: $5,200.00
P01600 - SEMI P16 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中の錫の測定
SEMI P16 - 黒鉛炉原子吸光分光法によるポジティブフォトレジスト・メタルイオンフリー（MIF）現像液中の錫の測定 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M02600 - SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers
SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00
G06400 - SEMI G64 - 全面めっきIC用リードフレーム（金，銀，銅，ニッケル，パラジウム/ニッケル，およびパラジウム）の仕様
SEMI G64 - 全面めっきIC用リードフレーム（金，銀，銅，ニッケル，パラジウム/ニッケル，およびパラジウム）の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M07400 - SEMI M74 - 直径450mmメカニカルハンドリング鏡面ウェーハの仕様
SEMI M74 - 直径450mmメカニカルハンドリング鏡面ウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P01600 - SEMI P16 - Determination of Tin in Positive Photoresist Metal Ion Free (MIF) Developers by Graphite Furnace Atomic Absorption Spectroscopy
SEMI P16 - Determination of Tin in Positive Photoresist Metal Ion Free (MIF) Developers by Graphite Furnace Atomic Absorption Spectroscopy Sale priceMember Price: $113.00
Non-Member Price: $193.00
M01900 - SEMI M19 - バルク・ガリウムヒ素単結晶基板の電気的性質（仕様）
SEMI M19 - バルク・ガリウムヒ素単結晶基板の電気的性質（仕様） Sale priceMember Price: $135.00
Non-Member Price: $231.00
MF065700 - SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning
SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning Sale priceMember Price: $113.00
Non-Member Price: $193.00
G02300 - SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法
SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
C09800 - SEMI C98 - Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing
SEMI C98 - Guide for Chemical Mechanical Planarization (CMP) Particle Size Distribution (PSD) Measurement and Reporting Used in Semiconductor Manufacturing Sale priceMember Price: $113.00
Non-Member Price: $193.00
M01900 - SEMI M19 - Specification for Electrical Properties of Bulk Gallium Arsenide Single Crystal Substrates
SEMI M19 - Specification for Electrical Properties of Bulk Gallium Arsenide Single Crystal Substrates Sale priceMember Price: $113.00
Non-Member Price: $193.00
D03400 - SEMI D34 - FPD偏光板の試験方法
SEMI D34 - FPD偏光板の試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P00800 - SEMI P8 - Test Method for the Determination of Water in Photoresist
SEMI P8 - Test Method for the Determination of Water in Photoresist Sale priceMember Price: $113.00
Non-Member Price: $193.00
F03700 - SEMI F37 - ガス供給システム構成部品の表面粗さパラメータの算出方法
SEMI F37 - ガス供給システム構成部品の表面粗さパラメータの算出方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G06200 - SEMI G62 - 銀めっきの試験方法
SEMI G62 - 銀めっきの試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
F06400 - SEMI F64 - マスフローコントローラの指示および実流量に対する圧力影響を測定する試験方法
SEMI F64 - マスフローコントローラの指示および実流量に対する圧力影響を測定する試験方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
M02400 - SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers
SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers Sale priceMember Price: $113.00
Non-Member Price: $193.00