SEMI 3D16 - Specification for Glass Base Material for Semiconductor Packaging

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1910 products

C09900 - SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $113.00
Non-Member Price: $193.00
F11600 - SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse
SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse Sale priceMember Price: $113.00
Non-Member Price: $193.00
Flex Electronics Webinar Master Class: July 2020 (On Demand)
Flex Electronics Webinar Master Class: July 2020 (On Demand) Sale priceMember Price: $25.00
Non-Member Price: $49.00
P04000 - SEMI P40 - 極紫外線リソグラフィマスクの取り付けに関する要求条件およびアライメント基準位置の仕様
SEMI P40 - 極紫外線リソグラフィマスクの取り付けに関する要求条件およびアライメント基準位置の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
T01600 - SEMI T16 - 極紫外線マスク自動識別用データマトリクス記号法適用の仕様
SEMI T16 - 極紫外線マスク自動識別用データマトリクス記号法適用の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
Flex Electronics Webinar Master Class: April 2021 (on demand)
Flex Electronics Webinar Master Class: April 2021 (on demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00
P03600 - SEMI P36 - 測長走査型電子顕微鏡（CD-SEM）用倍率標準試料のガイド
SEMI P36 - 測長走査型電子顕微鏡（CD-SEM）用倍率標準試料のガイド Sale priceMember Price: $135.00
Non-Member Price: $231.00
HB01300 - SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface
SEMI HB13 - Specification of Susceptors for HB-LED MOCVD Equipment Communication Interface Sale priceMember Price: $113.00
Non-Member Price: $193.00
G06100 - SEMI G61 - Specification for Cofired Ceramic Packages
SEMI G61 - Specification for Cofired Ceramic Packages Sale priceMember Price: $113.00
Non-Member Price: $150.00
Semiconductor Fabrication Worker Safety Part 2
Semiconductor Fabrication Worker Safety Part 2 Sale priceMember Price: $29.95
Non-Member Price: $43.15
G00900 - SEMI G9 - 仕様　スタンピングによる半導体プラスチックDIPパッケージ用リードフレーム
SEMI G9 - 仕様　スタンピングによる半導体プラスチックDIPパッケージ用リードフレーム Sale priceMember Price: $135.00
Non-Member Price: $180.00
E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows
SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows Sale priceMember Price: $113.00
Non-Member Price: $193.00
P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様
SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
T01200 - SEMI T12 - Specification for Tracing Jigs and Implements
SEMI T12 - Specification for Tracing Jigs and Implements Sale priceMember Price: $225.00
Non-Member Price: $380.00
G04700 - SEMI G47 - Specification for Plastic Molded Quad Flat Pack Leadframes
SEMI G47 - Specification for Plastic Molded Quad Flat Pack Leadframes Sale priceMember Price: $113.00
Non-Member Price: $150.00
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb)
SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: $113.00
Non-Member Price: $193.00
E18100 - SEMI E181 - Specification for Panel FOUP for Panel Level Packaging
SEMI E181 - Specification for Panel FOUP for Panel Level Packaging Sale priceMember Price: $113.00
Non-Member Price: $193.00
P00700 - SEMI P7 - 粘性決定方法，方法A－動粘度
SEMI P7 - 粘性決定方法，方法A－動粘度 Sale priceMember Price: $135.00
Non-Member Price: $231.00
P04400 - SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様
SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様 Sale priceMember Price: $135.00
Non-Member Price: $231.00
G07600 - SEMI G76 - TCP用ポリイミド接着テープの仕様
SEMI G76 - TCP用ポリイミド接着テープの仕様 Sale priceMember Price: $135.00
Non-Member Price: $180.00
M09000 - SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching Sale priceMember Price: $113.00
Non-Member Price: $193.00
P03100 - SEMI P31 - 化学増幅型（CA）フォトレジストパラメータのカタログ発行の作業方法
SEMI P31 - 化学増幅型（CA）フォトレジストパラメータのカタログ発行の作業方法 Sale priceMember Price: $135.00
Non-Member Price: $231.00
Flex Electronics Webinar Master Class Series: Batteries, AI, HI, Materials, Applications, Sustainability (On Demand 2021)
Flex Electronics Webinar Master Class Series: Batteries, AI, HI, Materials, Applications, Sustainability (On Demand 2021) Sale priceMember Price: $149.00
Non-Member Price: $229.00
PV09500 - SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance
SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance Sale priceMember Price: $113.00
Non-Member Price: $193.00