Products

2140 products

M02400 - SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers
SEMI M24 - Specification for Polished Monocrystalline Silicon Premium Wafers Sale priceMember Price: $113.00
Non-Member Price: $170.00
M02400 - SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様
SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $203.00
M02600 - SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers
M02600 - SEMI M26 - ウェーハの運搬に使用される100 mm,125 mm,150 mm,200 mmウェーハシッピングボックスの再利用ガイド
M02900 - SEMI M29 - 300 mmシッピングボックスの仕様
SEMI M29 - 300 mmシッピングボックスの仕様 Sale priceMember Price: $135.00
Non-Member Price: $203.00
M02900 - SEMI M29 - Specification for 300 mm Shipping Box
SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: $113.00
Non-Member Price: $170.00
M03000 - SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy
M03100 - SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様
M03100 - SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers - SEMI Dev 2
M03200 - SEMI M32 - Guide to Statistical Specifications
SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: $113.00
Non-Member Price: $170.00
M03200 - SEMI M32 - 統計的仕様のガイド
SEMI M32 - 統計的仕様のガイド Sale priceMember Price: $135.00
Non-Member Price: $203.00
M03300 - SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
M03400 - SEMI M34 - Guide for Specifying SIMOX Wafers
SEMI M34 - Guide for Specifying SIMOX Wafers Sale priceMember Price: $113.00
Non-Member Price: $170.00
M03400 - SEMI M34 - SIMOXウェーハを規定するための指針
SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: $135.00
Non-Member Price: $180.00
M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection
M03500 - SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド
M03600 - SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $135.00
Non-Member Price: $203.00
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $135.00
Non-Member Price: $203.00
M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers - SEMI Dev 2
SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $113.00
Non-Member Price: $170.00
M03800 - SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様
SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様 Sale priceMember Price: $135.00
Non-Member Price: $203.00
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法